Quantitative aspects of ohmic microscopy

Charles A. Cartier, Doe Kumsa, Zhange Feng, Huanfeng Zhu, Daniel Alberto Scherson

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

The potential difference between two microreference electrodes, Δφ sol, immersed in an aqueous sulfuric acid solution was monitored while performing conventional cyclic voltammetric experiments with a Pt disk electrode embedded in an insulating surface in an axisymmetric cell configuration. The resulting Δφ sol vs E curves, where E is the potential applied to the Pt disk electrode were remarkably similar to the voltammograms regardless of the position of the microreference probes. Most importantly, the actual values of Δφ sol were in very good agreement with those predicted by the primary current distribution using Newman's formalism (Newman, J. J. Electrochem. Soc.1966, 113, 501-502). These findings afford a solid basis for the development of ohmic microscopy as a quantitative tool for obtaining spatially resolved images of electrodes displaying nonhomogenous surfaces.

Original languageEnglish
Pages (from-to)7080-7084
Number of pages5
JournalAnalytical chemistry
Volume84
Issue number16
DOIs
Publication statusPublished - 2012 Aug 21
Externally publishedYes

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Microscopic examination
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Electrodes
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ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Cartier, C. A., Kumsa, D., Feng, Z., Zhu, H., & Scherson, D. A. (2012). Quantitative aspects of ohmic microscopy. Analytical chemistry, 84(16), 7080-7084. https://doi.org/10.1021/ac301361w

Quantitative aspects of ohmic microscopy. / Cartier, Charles A.; Kumsa, Doe; Feng, Zhange; Zhu, Huanfeng; Scherson, Daniel Alberto.

In: Analytical chemistry, Vol. 84, No. 16, 21.08.2012, p. 7080-7084.

Research output: Contribution to journalArticle

Cartier, CA, Kumsa, D, Feng, Z, Zhu, H & Scherson, DA 2012, 'Quantitative aspects of ohmic microscopy', Analytical chemistry, vol. 84, no. 16, pp. 7080-7084. https://doi.org/10.1021/ac301361w
Cartier CA, Kumsa D, Feng Z, Zhu H, Scherson DA. Quantitative aspects of ohmic microscopy. Analytical chemistry. 2012 Aug 21;84(16):7080-7084. https://doi.org/10.1021/ac301361w
Cartier, Charles A. ; Kumsa, Doe ; Feng, Zhange ; Zhu, Huanfeng ; Scherson, Daniel Alberto. / Quantitative aspects of ohmic microscopy. In: Analytical chemistry. 2012 ; Vol. 84, No. 16. pp. 7080-7084.
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