Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolution

Hyonchol Kim, Tsutomu Negishi, Masato Kudo, Hiroyuki Takei, Kenji Yasuda

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Discrimination of thin film elements by backscattered electron (BSE) imaging of field emission scanning electron microscope was examined. Incident electron acceleration voltage dependence on thin films' BSE intensities in five elements (Au, Ag, Ge, Cu and Fe) on a silicon substrate was experimentally measured from 3 to 30 kV. Normalization of BSE intensities using the difference between maximum and minimum brightness was proposed and allowed reproducible comparison among the elements. Measured intensities, which have correlation with electron backscattering coefficient against atomic number, indicated the existence of adequate acceleration voltage for improvement of resolution to discriminate different elements, showing the possibility of discriminating at least these six elements simultaneously by BSE imaging with nanometer-scale spatial resolution.

Original languageEnglish
Pages (from-to)379-385
Number of pages7
JournalJournal of Electron Microscopy
Volume59
Issue number5
DOIs
Publication statusPublished - 2010 Oct
Externally publishedYes

Fingerprint

Field emission
Electron Scanning Microscopy
electron flux density
discrimination
field emission
spatial resolution
Electrons
Imaging techniques
Scanning electron microscopy
scanning electron microscopy
electrons
electron acceleration
electric potential
thin films
backscattering
brightness
electron microscopes
Thin films
scanning
Electric potential

Keywords

  • acceleration voltage
  • backscattered electron
  • discrimination
  • field emission scanning electron microscopy
  • labeling
  • thin film elements

ASJC Scopus subject areas

  • Instrumentation

Cite this

Quantitative backscattered electron imaging of field emission scanning electron microscopy for discrimination of nano-scale elements with nm-order spatial resolution. / Kim, Hyonchol; Negishi, Tsutomu; Kudo, Masato; Takei, Hiroyuki; Yasuda, Kenji.

In: Journal of Electron Microscopy, Vol. 59, No. 5, 10.2010, p. 379-385.

Research output: Contribution to journalArticle

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