Quantitative learning effect evaluation of programming learning tools

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Children can learn programming using different tools. Understanding how the characteristics and features of each tool impact the learning effect will enhance learning. However, the impact of specific tools on the learning effect is unclear. In this study, we conducted a workshop to evaluate the characteristics and features of six tools on the learning effect. Our study reveals that the learning effect clearly differs between the six tools.

Original languageEnglish
Title of host publicationProceedings of 2017 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages209-216
Number of pages8
ISBN (Electronic)9781538609002
DOIs
Publication statusPublished - 2017 Jul 1
Event2017 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2017 - Tai Po, Hong Kong
Duration: 2017 Dec 122017 Dec 14

Publication series

NameProceedings of 2017 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2017
Volume2018-January

Other

Other2017 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2017
CountryHong Kong
CityTai Po
Period17/12/1217/12/14

Keywords

  • programming education
  • programming learning
  • programming learning tools

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Education

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    Saito, D., Sasaki, A., Washizaki, H., Fukazawa, Y., & Muto, Y. (2017). Quantitative learning effect evaluation of programming learning tools. In Proceedings of 2017 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2017 (pp. 209-216). (Proceedings of 2017 IEEE International Conference on Teaching, Assessment and Learning for Engineering, TALE 2017; Vol. 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TALE.2017.8252335