Quantitative surface chemical analysis of AuCu alloys with aes

K. Yoshihara, R. Shimizu, T. Homma, H. Tokutaka, K. Goto, M. Uemura, D. Fujita, A. Kurokawa, Shingo Ichimura, C. Oshima, M. Kurahashi, M. Kudo, Y. Hashiguchi, Y. Fukuda, T. Suzuki, T. Ohmura, F. Soeda, K. Tanaka, A. Tanaka, T. SekineY. Shiokawa, T. Hayashi

Research output: Contribution to journalArticle

24 Citations (Scopus)

Abstract

The Japanese VAMAS‐SCA working group is composed of 19 institutes. Three kinds of Au‐Cu alloys (Au25 at%‐Cu75 at%, Au50 at%‐Cu50 at%, Au75 at%‐Cu25 at%) were prepared, and these specimens were distributed to the members of Japanese VAMAS‐SCA working group and Auger peak amplitude ratios were measured to clarify the correlation factor of different types of spectrometers. The comparison was carried out by using the relative sensitivity factor for Au and Cu. The relative sensitivity factor for lower energy varied from spectrometer to spectrometer, but that for higher energy did not vary so much. Therefore, to carry out the inter‐laboratory comparison of the data, the transfer of the data of peak amplitude at higher energy should be recommended.

Original languageEnglish
Pages (from-to)125-130
Number of pages6
JournalSurface and Interface Analysis
Volume12
Issue number2
DOIs
Publication statusPublished - 1988 Jan 1
Externally publishedYes

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chemical analysis
Spectrometers
spectrometers
Chemical analysis
sensitivity
energy

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Yoshihara, K., Shimizu, R., Homma, T., Tokutaka, H., Goto, K., Uemura, M., ... Hayashi, T. (1988). Quantitative surface chemical analysis of AuCu alloys with aes. Surface and Interface Analysis, 12(2), 125-130. https://doi.org/10.1002/sia.740120212

Quantitative surface chemical analysis of AuCu alloys with aes. / Yoshihara, K.; Shimizu, R.; Homma, T.; Tokutaka, H.; Goto, K.; Uemura, M.; Fujita, D.; Kurokawa, A.; Ichimura, Shingo; Oshima, C.; Kurahashi, M.; Kudo, M.; Hashiguchi, Y.; Fukuda, Y.; Suzuki, T.; Ohmura, T.; Soeda, F.; Tanaka, K.; Tanaka, A.; Sekine, T.; Shiokawa, Y.; Hayashi, T.

In: Surface and Interface Analysis, Vol. 12, No. 2, 01.01.1988, p. 125-130.

Research output: Contribution to journalArticle

Yoshihara, K, Shimizu, R, Homma, T, Tokutaka, H, Goto, K, Uemura, M, Fujita, D, Kurokawa, A, Ichimura, S, Oshima, C, Kurahashi, M, Kudo, M, Hashiguchi, Y, Fukuda, Y, Suzuki, T, Ohmura, T, Soeda, F, Tanaka, K, Tanaka, A, Sekine, T, Shiokawa, Y & Hayashi, T 1988, 'Quantitative surface chemical analysis of AuCu alloys with aes', Surface and Interface Analysis, vol. 12, no. 2, pp. 125-130. https://doi.org/10.1002/sia.740120212
Yoshihara K, Shimizu R, Homma T, Tokutaka H, Goto K, Uemura M et al. Quantitative surface chemical analysis of AuCu alloys with aes. Surface and Interface Analysis. 1988 Jan 1;12(2):125-130. https://doi.org/10.1002/sia.740120212
Yoshihara, K. ; Shimizu, R. ; Homma, T. ; Tokutaka, H. ; Goto, K. ; Uemura, M. ; Fujita, D. ; Kurokawa, A. ; Ichimura, Shingo ; Oshima, C. ; Kurahashi, M. ; Kudo, M. ; Hashiguchi, Y. ; Fukuda, Y. ; Suzuki, T. ; Ohmura, T. ; Soeda, F. ; Tanaka, K. ; Tanaka, A. ; Sekine, T. ; Shiokawa, Y. ; Hayashi, T. / Quantitative surface chemical analysis of AuCu alloys with aes. In: Surface and Interface Analysis. 1988 ; Vol. 12, No. 2. pp. 125-130.
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AU - Suzuki, T.

AU - Ohmura, T.

AU - Soeda, F.

AU - Tanaka, K.

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AU - Shiokawa, Y.

AU - Hayashi, T.

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