Quantitative surface chemical analysis of AuCu alloys with aes

K. Yoshihara*, R. Shimizu, T. Homma, H. Tokutaka, K. Goto, M. Uemura, D. Fujita, A. Kurokawa, S. Ichimura, C. Oshima, M. Kurahashi, M. Kudo, Y. Hashiguchi, Y. Fukuda, T. Suzuki, T. Ohmura, F. Soeda, K. Tanaka, A. Tanaka, T. SekineY. Shiokawa, T. Hayashi

*Corresponding author for this work

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