### Abstract

We propose a method of operating a quantum state machine made of stacked quantum dots buried in adjacent to the channel of a spin field-effect transistor (FET) [S. Datta, B. Das, Appl. Phys. Lett. 56 (1990) 665; K. Yoh, et al., Proceedings of the 23rd International Conference on Physics of Semiconductors (ICPS) 2004; H. Ohno, K. Yoh et al., Jpn. J. Appl. Phys. 42 (2003) L87; K. Yoh, J. Konda, S. Shiina, N. Nishiguchi, Jpn. J. Appl. Phys. 36 (1997) 4134]. In this method, a spin blockade measurement extracts the quantum state of a nearest quantum dot through Coulomb blockade [K. Yoh, J. Konda, S. Shiina, N. Nishiguchi, Jpn. J. Appl. Phys. 36 (1997) 4134; K. Yoh, H. Kazama, Physica E 7 (2000) 440] of the adjacent channel conductance. Repeated quantum Zeno-like (QZ) measurements [H. Nakazato, et al., Phys. Rev. Lett. 90 (2003) 060401] of the spin blockade is shown to purify the quantum dot states within several repetitions. The growth constraints of the stacked InAs quantum dots are shown to provide an exchange interaction energy in the range of 0.01-1 meV [S. Itoh, et al., Jpn. J. Appl. Phys. 38 (1999) L917; A. Tackeuchi, et al., Jpn. J. Appl. Phys. 42 (2003) 4278]. We have verified that one can reach the fidelity of 90% by repeating the measurement twice, and that of 99.9% by repeating only eleven QZ measurements. Entangled states with two and three vertically stacked dots are achieved with the sampling frequency of the order of 100 MHz.

Original language | English |
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Pages (from-to) | 674-678 |

Number of pages | 5 |

Journal | Physica E: Low-Dimensional Systems and Nanostructures |

Volume | 29 |

Issue number | 3-4 |

DOIs | |

Publication status | Published - 2005 Nov |

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### Keywords

- Quantum dot
- Quantum Zeno-like measurement
- Qubit
- Spin blockade
- Spin transistor

### ASJC Scopus subject areas

- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics

### Cite this

*Physica E: Low-Dimensional Systems and Nanostructures*,

*29*(3-4), 674-678. https://doi.org/10.1016/j.physe.2005.06.052