Quasiresonant charge-exchange and reionization in low energy He+ scattering from Sn

R. Souda, T. Aizawa, C. Oshima, M. Aono, S. Tsuneyuki, M. Tsukada

    Research output: Contribution to journalArticle

    16 Citations (Scopus)

    Abstract

    The reionization of He atoms which also suffer quasiresonant charge-exchange is reported with use of both He+ and neutral He beams. The yield of reionized He atoms scattered from Sn shows no oscillatory structure as function of the energy. The reionization is caused by electron excitation along the antibonding orbital. In case of reionized He, the interference between the bonding and antibonding orbital is interrupted by the observation of the quasimolecular state.

    Original languageEnglish
    JournalSurface Science Letters
    Volume187
    Issue number1
    DOIs
    Publication statusPublished - 1987 Aug 2

    Fingerprint

    charge exchange
    Scattering
    orbitals
    Atoms
    neutral beams
    scattering
    atoms
    Ion exchange
    interference
    energy
    Electrons
    excitation
    electrons

    ASJC Scopus subject areas

    • Materials Chemistry
    • Surfaces, Coatings and Films
    • Condensed Matter Physics
    • Surfaces and Interfaces

    Cite this

    Quasiresonant charge-exchange and reionization in low energy He+ scattering from Sn. / Souda, R.; Aizawa, T.; Oshima, C.; Aono, M.; Tsuneyuki, S.; Tsukada, M.

    In: Surface Science Letters, Vol. 187, No. 1, 02.08.1987.

    Research output: Contribution to journalArticle

    Souda, R. ; Aizawa, T. ; Oshima, C. ; Aono, M. ; Tsuneyuki, S. ; Tsukada, M. / Quasiresonant charge-exchange and reionization in low energy He+ scattering from Sn. In: Surface Science Letters. 1987 ; Vol. 187, No. 1.
    @article{c0cc3792bff6408e82020c8d4138cef8,
    title = "Quasiresonant charge-exchange and reionization in low energy He+ scattering from Sn",
    abstract = "The reionization of He atoms which also suffer quasiresonant charge-exchange is reported with use of both He+ and neutral He beams. The yield of reionized He atoms scattered from Sn shows no oscillatory structure as function of the energy. The reionization is caused by electron excitation along the antibonding orbital. In case of reionized He, the interference between the bonding and antibonding orbital is interrupted by the observation of the quasimolecular state.",
    author = "R. Souda and T. Aizawa and C. Oshima and M. Aono and S. Tsuneyuki and M. Tsukada",
    year = "1987",
    month = "8",
    day = "2",
    doi = "10.1016/0167-2584(87)90853-X",
    language = "English",
    volume = "187",
    journal = "Surface Science",
    issn = "0039-6028",
    publisher = "Elsevier",
    number = "1",

    }

    TY - JOUR

    T1 - Quasiresonant charge-exchange and reionization in low energy He+ scattering from Sn

    AU - Souda, R.

    AU - Aizawa, T.

    AU - Oshima, C.

    AU - Aono, M.

    AU - Tsuneyuki, S.

    AU - Tsukada, M.

    PY - 1987/8/2

    Y1 - 1987/8/2

    N2 - The reionization of He atoms which also suffer quasiresonant charge-exchange is reported with use of both He+ and neutral He beams. The yield of reionized He atoms scattered from Sn shows no oscillatory structure as function of the energy. The reionization is caused by electron excitation along the antibonding orbital. In case of reionized He, the interference between the bonding and antibonding orbital is interrupted by the observation of the quasimolecular state.

    AB - The reionization of He atoms which also suffer quasiresonant charge-exchange is reported with use of both He+ and neutral He beams. The yield of reionized He atoms scattered from Sn shows no oscillatory structure as function of the energy. The reionization is caused by electron excitation along the antibonding orbital. In case of reionized He, the interference between the bonding and antibonding orbital is interrupted by the observation of the quasimolecular state.

    UR - http://www.scopus.com/inward/record.url?scp=0542374986&partnerID=8YFLogxK

    UR - http://www.scopus.com/inward/citedby.url?scp=0542374986&partnerID=8YFLogxK

    U2 - 10.1016/0167-2584(87)90853-X

    DO - 10.1016/0167-2584(87)90853-X

    M3 - Article

    VL - 187

    JO - Surface Science

    JF - Surface Science

    SN - 0039-6028

    IS - 1

    ER -