Fingerprint Dive into the research topics of 'Raman microscopy and scanning surface potential microscopy analysis of nanoscale defects on si wafer surfaces'. Together they form a unique fingerprint.
- Sort by
- Weight
- Alphabetically
Raman microscopy and scanning surface potential microscopy analysis of nanoscale defects on si wafer surfaces
Takayuki Homma, Masahiro Kato, Nobuhiro Kubo, Kaoruho Sakata, Masahiro Yanagisawa
Research output: Contribution to journal › Article › peer-review
2
Citations
(Scopus)