Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume

Ken Nishida; Minoru Osada; Syunshuke Wada; Shoji Okamoto; Risako Ueno; Hiroshi Funakubo; Takashi Katoda

doi:10.1143/JJAP.44.L827

Raman spectroscopic characterization of tetragonal PbZr_xTi _1-xO₃ thin films: A rapid evaluation method for c-domain volume

Ken Nishida, Minoru Osada, Syunshuke Wada, Shoji Okamoto, Risako Ueno, Hiroshi Funakubo, Takashi Katoda

Research output: Contribution to journal › Article

16 Citations (Scopus)

Abstract

We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZr_xTi _1-xO₃ (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A₁(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

Original language	English
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	44
Issue number	24-27
DOIs	https://doi.org/10.1143/JJAP.44.L827
Publication status	Published - 2005 Jun 24
Externally published	Yes

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Keywords

Domain distribution
Pbzrtio (pzt)
Raman scattering
Thin film

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Cite this

Nishida, K., Osada, M., Wada, S., Okamoto, S., Ueno, R., Funakubo, H., & Katoda, T. (2005). Raman spectroscopic characterization of tetragonal PbZr_xTi _1-xO₃ thin films: A rapid evaluation method for c-domain volume. Japanese Journal of Applied Physics, Part 2: Letters, 44(24-27). https://doi.org/10.1143/JJAP.44.L827

Raman spectroscopic characterization of tetragonal PbZr_xTi _1-xO₃ thin films : A rapid evaluation method for c-domain volume. / Nishida, Ken; Osada, Minoru; Wada, Syunshuke; Okamoto, Shoji; Ueno, Risako; Funakubo, Hiroshi; Katoda, Takashi.

In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 44, No. 24-27, 24.06.2005.

Research output: Contribution to journal › Article

@article{10b2e2e3891e405f89003eb961a50b65,

title = "Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume",

abstract = "We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.",

keywords = "Domain distribution, Pbzrtio (pzt), Raman scattering, Thin film",

author = "Ken Nishida and Minoru Osada and Syunshuke Wada and Shoji Okamoto and Risako Ueno and Hiroshi Funakubo and Takashi Katoda",

year = "2005",

month = jun

day = "24",

doi = "10.1143/JJAP.44.L827",

language = "English",

volume = "44",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "24-27",

}

TY - JOUR

T1 - Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films

T2 - A rapid evaluation method for c-domain volume

AU - Nishida, Ken

AU - Osada, Minoru

AU - Wada, Syunshuke

AU - Okamoto, Shoji

AU - Ueno, Risako

AU - Funakubo, Hiroshi

AU - Katoda, Takashi

PY - 2005/6/24

Y1 - 2005/6/24

N2 - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

AB - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

KW - Domain distribution

KW - Pbzrtio (pzt)

KW - Raman scattering

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=32044439604&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=32044439604&partnerID=8YFLogxK

U2 - 10.1143/JJAP.44.L827

DO - 10.1143/JJAP.44.L827

M3 - Article

AN - SCOPUS:32044439604

VL - 44

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 24-27

ER -

Access to Document

10.1143/JJAP.44.L827