Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume

Ken Nishida; Minoru Osada; Syunshuke Wada; Shoji Okamoto; Risako Ueno; Hiroshi Funakubo; Takashi Katoda

doi:10.1143/JJAP.44.L827

Raman spectroscopic characterization of tetragonal PbZr_xTi _1-xO₃ thin films: A rapid evaluation method for c-domain volume

Ken Nishida, Minoru Osada, Syunshuke Wada, Shoji Okamoto, Risako Ueno, Hiroshi Funakubo, Takashi Katoda

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZr_xTi _1-xO₃ (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A₁(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

Original language	English
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	44
Issue number	24-27
DOIs	https://doi.org/10.1143/JJAP.44.L827
Publication status	Published - 2005 Jun 24
Externally published	Yes

Keywords

Domain distribution
Pbzrtio (pzt)
Raman scattering
Thin film

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1143/JJAP.44.L827

Fingerprint Dive into the research topics of 'Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume'. Together they form a unique fingerprint.

Cite this

Raman spectroscopic characterization of tetragonal PbZr_xTi _1-xO₃ thin films : A rapid evaluation method for c-domain volume. / Nishida, Ken; Osada, Minoru; Wada, Syunshuke; Okamoto, Shoji; Ueno, Risako; Funakubo, Hiroshi; Katoda, Takashi.

In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 44, No. 24-27, 24.06.2005.

Research output: Contribution to journal › Article › peer-review

@article{10b2e2e3891e405f89003eb961a50b65,

title = "Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume",

abstract = "We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.",

keywords = "Domain distribution, Pbzrtio (pzt), Raman scattering, Thin film",

author = "Ken Nishida and Minoru Osada and Syunshuke Wada and Shoji Okamoto and Risako Ueno and Hiroshi Funakubo and Takashi Katoda",

year = "2005",

month = jun,

day = "24",

doi = "10.1143/JJAP.44.L827",

language = "English",

volume = "44",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",

issn = "0021-4922",

publisher = "Japan Society of Applied Physics",

number = "24-27",

}

TY - JOUR

T1 - Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films

T2 - A rapid evaluation method for c-domain volume

AU - Nishida, Ken

AU - Osada, Minoru

AU - Wada, Syunshuke

AU - Okamoto, Shoji

AU - Ueno, Risako

AU - Funakubo, Hiroshi

AU - Katoda, Takashi

PY - 2005/6/24

Y1 - 2005/6/24

N2 - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

AB - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

KW - Domain distribution

KW - Pbzrtio (pzt)

KW - Raman scattering

KW - Thin film

UR - http://www.scopus.com/inward/record.url?scp=32044439604&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=32044439604&partnerID=8YFLogxK

U2 - 10.1143/JJAP.44.L827

DO - 10.1143/JJAP.44.L827

M3 - Article

AN - SCOPUS:32044439604

VL - 44

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 24-27

ER -