Abstract
We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.
| Original language | English |
|---|---|
| Journal | Japanese Journal of Applied Physics, Part 2: Letters |
| Volume | 44 |
| Issue number | 24-27 |
| DOIs | |
| Publication status | Published - 2005 Jun 24 |
| Externally published | Yes |
Fingerprint
Keywords
- Domain distribution
- Pbzrtio (pzt)
- Raman scattering
- Thin film
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films : A rapid evaluation method for c-domain volume. / Nishida, Ken; Osada, Minoru; Wada, Syunshuke; Okamoto, Shoji; Ueno, Risako; Funakubo, Hiroshi; Katoda, Takashi.
In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 44, No. 24-27, 24.06.2005.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films
T2 - A rapid evaluation method for c-domain volume
AU - Nishida, Ken
AU - Osada, Minoru
AU - Wada, Syunshuke
AU - Okamoto, Shoji
AU - Ueno, Risako
AU - Funakubo, Hiroshi
AU - Katoda, Takashi
PY - 2005/6/24
Y1 - 2005/6/24
N2 - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.
AB - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.
KW - Domain distribution
KW - Pbzrtio (pzt)
KW - Raman scattering
KW - Thin film
UR - http://www.scopus.com/inward/record.url?scp=32044439604&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=32044439604&partnerID=8YFLogxK
U2 - 10.1143/JJAP.44.L827
DO - 10.1143/JJAP.44.L827
M3 - Article
AN - SCOPUS:32044439604
VL - 44
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 24-27
ER -