Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume

Ken Nishida; Minoru Osada; Syunshuke Wada; Shoji Okamoto; Risako Ueno; Hiroshi Funakubo; Takashi Katoda

doi:10.1143/JJAP.44.L827

Raman spectroscopic characterization of tetragonal PbZr_xTi _1-xO₃ thin films: A rapid evaluation method for c-domain volume

Ken Nishida^*, Minoru Osada, Syunshuke Wada, Shoji Okamoto, Risako Ueno, Hiroshi Funakubo, Takashi Katoda

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZr_xTi _1-xO₃ (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A₁(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

Original language	English
Journal	Japanese Journal of Applied Physics, Part 2: Letters
Volume	44
Issue number	24-27
DOIs	https://doi.org/10.1143/JJAP.44.L827
Publication status	Published - 2005 Jun 24
Externally published	Yes

Keywords

Domain distribution
Pbzrtio (pzt)
Raman scattering
Thin film

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

Access to Document

10.1143/JJAP.44.L827

Cite this

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title = "Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films: A rapid evaluation method for c-domain volume",

abstract = "We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.",

keywords = "Domain distribution, Pbzrtio (pzt), Raman scattering, Thin film",

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year = "2005",

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doi = "10.1143/JJAP.44.L827",

language = "English",

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T1 - Raman spectroscopic characterization of tetragonal PbZrxTi 1-xO3 thin films

T2 - A rapid evaluation method for c-domain volume

AU - Nishida, Ken

AU - Osada, Minoru

AU - Wada, Syunshuke

AU - Okamoto, Shoji

AU - Ueno, Risako

AU - Funakubo, Hiroshi

AU - Katoda, Takashi

PY - 2005/6/24

Y1 - 2005/6/24

N2 - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

AB - We present the use of Raman spectroscopy as a rapid and convenient evaluation tool for domain distribution of tetragonal PbZrxTi 1-xO3 (PZT) thin films. From polarized Raman analyses of epitaxial PZT thin films with various c-domain volumes, we found that the intensity of the A1(TO) modes linearly scales with the c-domain volume. These observations, as well as the quick and nondestructive characteristics of this technique, clearly imply that Raman spectroscopy has enormous potential to quantify the fraction of c-domain volumes in a wide range of PZT devices.

KW - Domain distribution

KW - Pbzrtio (pzt)

KW - Raman scattering

KW - Thin film

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