Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films: A rapid distinction method for fluorite and pyrochlore phases

Minoru Osada*, Masato Kakihana, Masatoshi Mitsuya, Takayuki Watanabe, Hiroshi Funakubo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)


We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number8 B
Publication statusPublished - 2001 Aug 15
Externally publishedYes


  • Fluorite
  • Impurity phase
  • Phase identification
  • Pyrochlore
  • Raman scattering
  • SrBi(TaNb)O (SBTN)

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)


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