Raman spectroscopy evaluation of oxygen vacancy migration by electrical field in multilayer ceramic capacitors

Ken Nishida, Hiroshi Kishi, Minoru Osada, Hiroshi Funakubo, Masamichi Nishide, Hironari Takeuchi, Takashi Katoda, Takashi Yamamoto

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Raman spectroscopy is used to evaluate migration behavior of oxygen vacancies in BaTiO3-based multilayer ceramic capacitors with Ni internal electrodes (Ni-MLCCs) before and after a highly accelerated life test (HALT). The B1 phonon mode of BaTiO3 that is associated with oxygen vibration was hardened and broadened near the Ni electrodes before HALT. However, the hardening and broadening of the B1 mode were observed near the cathodes after HALT. It is considered that the oxygen vacancies were localized near the Ni electrodes before HALT and they electromigrated toward the cathode because they have the positive charges. These results show that oxygen vacancies migrated and accumulated near the cathode under a dc bias and caused insulation resistance degradation in MLCCs. In addition, Raman spectroscopy is a powerful tool for investigation of structural defect distribution including oxygen vacancies with a relatively high spatial resolution.

Original languageEnglish
JournalJapanese Journal of Applied Physics
Volume48
Issue number9 Part 2
DOIs
Publication statusPublished - 2009
Externally publishedYes

Fingerprint

Ceramic capacitors
accelerated life tests
Oxygen vacancies
Raman spectroscopy
capacitors
Multilayers
ceramics
Cathodes
evaluation
oxygen
Electrodes
cathodes
electrodes
Hardening
Insulation
insulation
hardening
Degradation
Defects
spatial resolution

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Raman spectroscopy evaluation of oxygen vacancy migration by electrical field in multilayer ceramic capacitors. / Nishida, Ken; Kishi, Hiroshi; Osada, Minoru; Funakubo, Hiroshi; Nishide, Masamichi; Takeuchi, Hironari; Katoda, Takashi; Yamamoto, Takashi.

In: Japanese Journal of Applied Physics, Vol. 48, No. 9 Part 2, 2009.

Research output: Contribution to journalArticle

Nishida, K, Kishi, H, Osada, M, Funakubo, H, Nishide, M, Takeuchi, H, Katoda, T & Yamamoto, T 2009, 'Raman spectroscopy evaluation of oxygen vacancy migration by electrical field in multilayer ceramic capacitors', Japanese Journal of Applied Physics, vol. 48, no. 9 Part 2. https://doi.org/10.1143/JJAP.48.09KF11
Nishida, Ken ; Kishi, Hiroshi ; Osada, Minoru ; Funakubo, Hiroshi ; Nishide, Masamichi ; Takeuchi, Hironari ; Katoda, Takashi ; Yamamoto, Takashi. / Raman spectroscopy evaluation of oxygen vacancy migration by electrical field in multilayer ceramic capacitors. In: Japanese Journal of Applied Physics. 2009 ; Vol. 48, No. 9 Part 2.
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AU - Nishide, Masamichi

AU - Takeuchi, Hironari

AU - Katoda, Takashi

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