Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen

Shingo Kobayashi, Nobuyuki Hasebe, Takehiro Hosojima, Takeshi Ishizaki, Kazuhiro Iwamatsu, Mitsuteru Mimura, Takashi Miyachi, Mitsuhiro Miyajima, Kirill Pushkin, Chikara Tezuka, Tadayoshi Doke, Masanori Kobayashi, Eido Shibamura, Akihiro Ishizuka

    Research output: Contribution to journalArticle

    13 Citations (Scopus)

    Abstract

    We have obtained the ratio of the transverse diffusion coefficient to the mobility of electrons multiplied by the elementary charge, in Xe and Xe + H 2 under electric fields at a higher pressure of 1 MPa in comparison with those in preceding experiments. The results show that the density effect (nonlinear effect) of the ratio in both pure Xe and Xe + H2 is ≤15% below 1 MPa over the reduced electric field range from 0.08 to 0.6 × 10-17 V·cm2. We also found that the diffusion of an electron swarm is suppressed by adding trace amount of hydrogen to high-pressure xenon gas. We discuss the application of Xe + H2 gas to a new gamma-ray camera.

    Original languageEnglish
    Pages (from-to)7894-7900
    Number of pages7
    JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    Volume45
    Issue number10 A
    DOIs
    Publication statusPublished - 2006 Oct 15

    Keywords

    • Characteristic energy of electrons
    • High-pressure xenon gas
    • Hydrogen
    • Time projection chamber
    • Transverse diffusion coefficient

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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  • Cite this

    Kobayashi, S., Hasebe, N., Hosojima, T., Ishizaki, T., Iwamatsu, K., Mimura, M., Miyachi, T., Miyajima, M., Pushkin, K., Tezuka, C., Doke, T., Kobayashi, M., Shibamura, E., & Ishizuka, A. (2006). Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon and xenon doped with hydrogen. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 45(10 A), 7894-7900. https://doi.org/10.1143/JJAP.45.7894