Ratio of transverse diffusion coefficient to mobility of electrons in high-pressure xenon

Shingo Kobayashi, Nobuyuki Hasebe, Tsutomu Igarashi, Takashi Miyachi, Mitsuhiro Miyajima, Hiroyuki Okada, Tadayoshi Doke, Eido Shibamura, Valery V. Dmitrenko, Konstantin F. Vlasik

    Research output: Contribution to journalArticlepeer-review

    14 Citations (Scopus)

    Abstract

    We constructed a parallel plate drift chamber for measuring the ratio of the transverse diffusion coefficient Dt to the mobility μ of electrons multiplied by the elementary charge e, eDt/μ, which is called the transverse characteristic energy, in high-pressure xenon gas. The characteristic energies of electrons in Xe were obtained at a high pressure of 1.0MPa and the reduced electric field, E/N, from 0.77 to 7.7 × 10 -18 V·Cm2, where E denotes an electric field and N the number density of Xe atoms. At the same E/N, our results agreed well with the data at pressures from 107 to 193 kPa previously obtained by Koizumi et al. [J. Phys. B 19 (1986) 2331]. The characteristic energies of electrons in Xe were found to be constant as a function of E/N from a low pressure to 1.0MPa.

    Original languageEnglish
    Pages (from-to)5568-5572
    Number of pages5
    JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    Volume43
    Issue number8 A
    DOIs
    Publication statusPublished - 2004 Aug 1

    Keywords

    • Characteristic energy of electrons
    • H
    • High-pressure xenon gas
    • Time projection chamber
    • Transverse diffusion coefficient

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

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