Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media

S. Tsuboi, H. Matsutera, T. Ishi, N. Ishiwata, K. Ohashi

Research output: Contribution to journalConference article

1 Citation (Scopus)


The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.

Original languageEnglish
Pages (from-to)375-381
Number of pages7
JournalJournal of Magnetism and Magnetic Materials
Issue number1-3
Publication statusPublished - 2001 Oct 1
EventProceedings of the 5th Perpendicular Magnetic Recording Conference (PMRC 2000) - Sendai, Japan
Duration: 2000 Oct 232000 Oct 26



  • Co-Ni-Fe head
  • Focused-ion-beam
  • Perpendicular magnetic recording
  • Pole thickness
  • Recording head

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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