Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media

S. Tsuboi, H. Matsutera, T. Ishi, N. Ishiwata, Keishi Ohashi

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.

Original languageEnglish
Pages (from-to)375-381
Number of pages7
JournalJournal of Magnetism and Magnetic Materials
Volume235
Issue number1-3
DOIs
Publication statusPublished - 2001 Oct
Externally publishedYes

Fingerprint

Magnetic recording
Focused ion beams
magnetic recording
ion beams
Magnetic fields
recording heads
gradients
trailing edges
magnetic fields
Poles
Signal to noise ratio
signal to noise ratios
poles

Keywords

  • Co-Ni-Fe head
  • Focused-ion-beam
  • Perpendicular magnetic recording
  • Pole thickness
  • Recording head

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media. / Tsuboi, S.; Matsutera, H.; Ishi, T.; Ishiwata, N.; Ohashi, Keishi.

In: Journal of Magnetism and Magnetic Materials, Vol. 235, No. 1-3, 10.2001, p. 375-381.

Research output: Contribution to journalArticle

@article{1f150362859e4cd0949487048fa8856b,
title = "Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media",
abstract = "The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.",
keywords = "Co-Ni-Fe head, Focused-ion-beam, Perpendicular magnetic recording, Pole thickness, Recording head",
author = "S. Tsuboi and H. Matsutera and T. Ishi and N. Ishiwata and Keishi Ohashi",
year = "2001",
month = "10",
doi = "10.1016/S0304-8853(01)00384-5",
language = "English",
volume = "235",
pages = "375--381",
journal = "Journal of Magnetism and Magnetic Materials",
issn = "0304-8853",
publisher = "Elsevier",
number = "1-3",

}

TY - JOUR

T1 - Read/write characteristics of focused-ion-beam-etched heads for perpendicular magnetic recording media

AU - Tsuboi, S.

AU - Matsutera, H.

AU - Ishi, T.

AU - Ishiwata, N.

AU - Ohashi, Keishi

PY - 2001/10

Y1 - 2001/10

N2 - The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.

AB - The read/write characteristics for perpendicular magnetic recording media of focused-ion-beam (FIB)-etched recording heads were investigated. It was found that the trailing edge of an FIB-etched head produces a higher gradient in the magnetic field perpendicular to the medium than a head which has not been etched. The signal-to-noise ratio of the medium increased with the FIB-etched write gap. A high-Bs and thin pole increased the magnetic field's gradient in the perpendicular direction, resulting in excellent read/write characteristics.

KW - Co-Ni-Fe head

KW - Focused-ion-beam

KW - Perpendicular magnetic recording

KW - Pole thickness

KW - Recording head

UR - http://www.scopus.com/inward/record.url?scp=0035477433&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035477433&partnerID=8YFLogxK

U2 - 10.1016/S0304-8853(01)00384-5

DO - 10.1016/S0304-8853(01)00384-5

M3 - Article

AN - SCOPUS:0035477433

VL - 235

SP - 375

EP - 381

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

SN - 0304-8853

IS - 1-3

ER -