Redesign for untrusted gate-level netlists

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    This paper proposes a redesign technique which designs from untrusted netlists to trusted netlists. Our approach consists of two phases, detection phase and invalidation phase. The detection phase picks up suspicious hardware Trojans (HTs) by pattern matching. The invalidation phase modifies the suspicious HTs in order not to activate them. In the invalidation phase, three invalidation techniques are selected by analyzing location of suspicious malicious nets. Applying appropriately the invalidation technique to the nets can correctly invalidate HTs. In our results, the proposed technique can successfully invalidate HTs on several Trust-HUB benchmarks without HT activations. The results clearly demonstrate that our redesign technique is very effective to remove HT risks.

    Original languageEnglish
    Title of host publication2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages219-220
    Number of pages2
    ISBN (Electronic)9781509015061
    DOIs
    Publication statusPublished - 2016 Oct 20
    Event22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 - Sant Feliu de Guixols, Catalunya, Spain
    Duration: 2016 Jul 42016 Jul 6

    Other

    Other22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016
    CountrySpain
    CitySant Feliu de Guixols, Catalunya
    Period16/7/416/7/6

    Fingerprint

    Hardware
    Pattern matching
    Chemical activation

    Keywords

    • design for security
    • gate-level netlist
    • hardware security
    • hardware Trojans
    • redesign

    ASJC Scopus subject areas

    • Hardware and Architecture
    • Safety, Risk, Reliability and Quality
    • Computer Networks and Communications

    Cite this

    Oya, M., Yanagisawa, M., & Togawa, N. (2016). Redesign for untrusted gate-level netlists. In 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 (pp. 219-220). [7604706] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2016.7604706

    Redesign for untrusted gate-level netlists. / Oya, Masaru; Yanagisawa, Masao; Togawa, Nozomu.

    2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016. Institute of Electrical and Electronics Engineers Inc., 2016. p. 219-220 7604706.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Oya, M, Yanagisawa, M & Togawa, N 2016, Redesign for untrusted gate-level netlists. in 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016., 7604706, Institute of Electrical and Electronics Engineers Inc., pp. 219-220, 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Catalunya, Spain, 16/7/4. https://doi.org/10.1109/IOLTS.2016.7604706
    Oya M, Yanagisawa M, Togawa N. Redesign for untrusted gate-level netlists. In 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016. Institute of Electrical and Electronics Engineers Inc. 2016. p. 219-220. 7604706 https://doi.org/10.1109/IOLTS.2016.7604706
    Oya, Masaru ; Yanagisawa, Masao ; Togawa, Nozomu. / Redesign for untrusted gate-level netlists. 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016. Institute of Electrical and Electronics Engineers Inc., 2016. pp. 219-220
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