Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces

H. Sasaki; M. Aoki; H. Kawarada

doi:10.1016/0925-9635(93)90007-O

Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces

H. Sasaki^*, M. Aoki, H. Kawarada

^*Corresponding author for this work

School of Fundamental Science and Engineering

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.

Original language	English
Pages (from-to)	1271-1276
Number of pages	6
Journal	Diamond and Related Materials
Volume	2
Issue number	9
DOIs	https://doi.org/10.1016/0925-9635(93)90007-O
Publication status	Published - 1993 Jul 1

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Chemistry(all)
Mechanical Engineering
Materials Chemistry
Electrical and Electronic Engineering

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10.1016/0925-9635(93)90007-O

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title = "Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces",

abstract = "Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.",

author = "H. Sasaki and M. Aoki and H. Kawarada",

note = "Funding Information: The authors would like to thank Mr. K. Tsugawa, Mr. A. Yamaguchi, Dr. K. Tsukui and Professor I. Ohdomari for their collaboration and advice, and also to Professor T. Osaka of Kagami Memorial Laboratory for Materials Science and Technology for his support, Mr. N. Fujimori of Sumitomo Electric Industries, Ltd. and Mr. T. Yamashita of Tokyo Gas Co., Ltd. for their cooperation. This work was supported in part by Grants-",

year = "1993",

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doi = "10.1016/0925-9635(93)90007-O",

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T1 - Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces

AU - Sasaki, H.

AU - Aoki, M.

AU - Kawarada, H.

N1 - Funding Information: The authors would like to thank Mr. K. Tsugawa, Mr. A. Yamaguchi, Dr. K. Tsukui and Professor I. Ohdomari for their collaboration and advice, and also to Professor T. Osaka of Kagami Memorial Laboratory for Materials Science and Technology for his support, Mr. N. Fujimori of Sumitomo Electric Industries, Ltd. and Mr. T. Yamashita of Tokyo Gas Co., Ltd. for their cooperation. This work was supported in part by Grants-

PY - 1993/7/1

Y1 - 1993/7/1

N2 - Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.

AB - Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.

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VL - 2

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EP - 1276

JO - Diamond and Related Materials

JF - Diamond and Related Materials

IS - 9

ER -

Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces

Abstract

ASJC Scopus subject areas

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