Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces

H. Sasaki, M. Aoki, Hiroshi Kawarada

    Research output: Contribution to journalArticle

    21 Citations (Scopus)

    Abstract

    Reflection electron microscopy (REM) and scanning tunneling microscopy have been applied to the estimation of the surface flatness of diamond (001) surfaces and to the 2 × 1 reconstructed structure. The macroscopic surface flatness observed by REM has been improved by using CO as a source gas and by boron-doping.

    Original languageEnglish
    Pages (from-to)1271-1276
    Number of pages6
    JournalDiamond and Related Materials
    Volume2
    Issue number9
    DOIs
    Publication statusPublished - 1993 Jul 1

    Fingerprint

    Diamond
    Chemical vapor deposition
    Diamonds
    Microscopes
    Electron microscopes
    electron microscopes
    diamonds
    microscopes
    vapor deposition
    flatness
    Scanning
    Electron microscopy
    scanning
    electron microscopy
    Boron
    Scanning tunneling microscopy
    Carbon Monoxide
    scanning tunneling microscopy
    boron
    Gases

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Materials Chemistry
    • Surfaces, Coatings and Films
    • Surfaces and Interfaces

    Cite this

    Reflection electron microscope and scanning tunneling microscope observations of CVD diamond (001) surfaces. / Sasaki, H.; Aoki, M.; Kawarada, Hiroshi.

    In: Diamond and Related Materials, Vol. 2, No. 9, 01.07.1993, p. 1271-1276.

    Research output: Contribution to journalArticle

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