Reliability simulation of AC hot carrier degradation for deep sub-micron MOSFETs

Satoshi Shimizu, Motoaki Tanizawa, Shigeru Kusunoki, Masahide Inuishi, Hirokazu Miyoshi

Research output: Contribution to journalArticle

Fingerprint Dive into the research topics of 'Reliability simulation of AC hot carrier degradation for deep sub-micron MOSFETs'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science