RELIABLE 1-MBIT DRAM WITH A MULTI-BIT-TEST MODE.

Masaki Kumanoya*, Kazuyasu Fujishima, Hideshi Miyatake, Yasumasa Nishimura, Kazunori Saito, Takayuki Matsukawa, Tsutomu Yoshihara, Takao Nakano

*Corresponding author for this work

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7 Citations (Scopus)

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Engineering & Materials Science