Remaining service life diagnostic technology of phenol insulators for power distribution equipment

S. Miki, T. Hasegawa, S. Umemura, H. Okazawa, Y. Otsuka, Hiroshi Inujima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We have applied a remaining service life diagnostic technology to phenol insulators of power distribution equipment. Application of chemical evaluation and the Mahalanobis-Taguchi (MT) method enabled us to diagnose the insulators' degree of deterioration with great accuracy and nondestructively on-site. Time was defined as the end of service life when electrical discharge was initiated and a remaining service life was presumed from the diagnostic results by the MT method and the year in which the master curve of service life and the threshold value intersect. Surface resistivity (threshold value) for electrical discharge initiation can be calculated from creepage distance, permittivity, frequency, etc.. It was clarified that a remaining service life for phenol insulators could be presumed by this technology because there was a good relationship between the check examination results of electric discharge initiation in the laboratory and the presumption results.

Original languageEnglish
Title of host publicationAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
Pages41-44
Number of pages4
DOIs
Publication statusPublished - 2007
Event2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP - Vancouver, BC, Canada
Duration: 2007 Oct 142007 Oct 19

Other

Other2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP
CountryCanada
CityVancouver, BC
Period07/10/1407/10/19

Fingerprint

Phenol
Service life
Phenols
Taguchi methods
Electric discharges
Deterioration
Permittivity

ASJC Scopus subject areas

  • Engineering(all)
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Miki, S., Hasegawa, T., Umemura, S., Okazawa, H., Otsuka, Y., & Inujima, H. (2007). Remaining service life diagnostic technology of phenol insulators for power distribution equipment. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP (pp. 41-44). [4451467] https://doi.org/10.1109/CEIDP.2007.4451467

Remaining service life diagnostic technology of phenol insulators for power distribution equipment. / Miki, S.; Hasegawa, T.; Umemura, S.; Okazawa, H.; Otsuka, Y.; Inujima, Hiroshi.

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2007. p. 41-44 4451467.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Miki, S, Hasegawa, T, Umemura, S, Okazawa, H, Otsuka, Y & Inujima, H 2007, Remaining service life diagnostic technology of phenol insulators for power distribution equipment. in Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP., 4451467, pp. 41-44, 2007 Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP, Vancouver, BC, Canada, 07/10/14. https://doi.org/10.1109/CEIDP.2007.4451467
Miki S, Hasegawa T, Umemura S, Okazawa H, Otsuka Y, Inujima H. Remaining service life diagnostic technology of phenol insulators for power distribution equipment. In Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2007. p. 41-44. 4451467 https://doi.org/10.1109/CEIDP.2007.4451467
Miki, S. ; Hasegawa, T. ; Umemura, S. ; Okazawa, H. ; Otsuka, Y. ; Inujima, Hiroshi. / Remaining service life diagnostic technology of phenol insulators for power distribution equipment. Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP. 2007. pp. 41-44
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