Robust secure scan design against scan-based differential cryptanalysis

Youhua Shi, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

    Research output: Contribution to journal › Article

    19 Citations (Scopus)

    Abstract

    Scan technology carries the potential risk of being misused as a side channel to leak out the secrets of crypto cores. The existing scan-based attacks could be viewed as one kind of differential cryptanalysis, which takes advantages of scan chains to observe the bit changes between pairs of chosen plaintexts so as to identify the secret keys. To address such a design/test challenge, this paper proposes a robust secure scan structure design for crypto cores as a countermeasure against scan-based attacks to maintain high security without compromising the testability.

    Original languageEnglish
    Article number5734887
    Pages (from-to)176-181
    Number of pages6
    JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
    Volume20
    Issue number1
    DOIs
    Publication statusPublished - 2012 Jan

    Keywords

    • Crypto hardware
    • Differential cryptanalysis
    • Scan-based discrete Fourier transform (DFT)
    • Security
    • Side channel attack
    • Testability

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Hardware and Architecture
    • Software

    Cite this

    Robust secure scan design against scan-based differential cryptanalysis. / Shi, Youhua; Togawa, Nozomu; Yanagisawa, Masao; Ohtsuki, Tatsuo.

    In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 20, No. 1, 5734887, 01.2012, p. 176-181.

    Research output: Contribution to journal › Article

    Shi, Y, Togawa, N, Yanagisawa, M & Ohtsuki, T 2012, 'Robust secure scan design against scan-based differential cryptanalysis', IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 20, no. 1, 5734887, pp. 176-181. https://doi.org/10.1109/TVLSI.2011.2120635
    Shi Y, Togawa N, Yanagisawa M, Ohtsuki T. Robust secure scan design against scan-based differential cryptanalysis. IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2012 Jan;20(1):176-181. 5734887. https://doi.org/10.1109/TVLSI.2011.2120635
    Shi, Youhua ; Togawa, Nozomu ; Yanagisawa, Masao ; Ohtsuki, Tatsuo. / Robust secure scan design against scan-based differential cryptanalysis. In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2012 ; Vol. 20, No. 1. pp. 176-181.
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