Robustness of syndrome analysis method in highly structured fault-diagnosis systems

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    F. P. Preparata et al. proposed a fault diagnosis model (PMC model) to find all fault units in the multicomputer system by using outcomes that each unit tests some other units. T. Kohda proposed a highly structured(HS) system and the syndrome analysis method(SAM) to diagnose from local testing results. In this paper, we introduce the maximum a posteriori probability algorithm(MAPDA) for the HS system in the probabilistic fault model. Analyzing the MAPDA, we show that the SAM is closer to the MAPDA as the fault probability becomes smaller. Finally, we show the robustness of the SAM in the HS system.

    Original languageEnglish
    Title of host publicationConference Proceedings - IEEE International Conference on Systems, Man and Cybernetics
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages2757-2763
    Number of pages7
    Volume2014-January
    EditionJanuary
    DOIs
    Publication statusPublished - 2014
    Event2014 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2014 - San Diego, United States
    Duration: 2014 Oct 52014 Oct 8

    Other

    Other2014 IEEE International Conference on Systems, Man, and Cybernetics, SMC 2014
    CountryUnited States
    CitySan Diego
    Period14/10/514/10/8

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    Keywords

    • Highly structured system
    • Multicomputer system
    • PMC model
    • Probabilistic fault diagnosis
    • System-level fault diagnosis

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Control and Systems Engineering
    • Human-Computer Interaction

    Cite this

    Kobayashi, M., Goto, M., Matsushima, T., & Hirasawa, S. (2014). Robustness of syndrome analysis method in highly structured fault-diagnosis systems. In Conference Proceedings - IEEE International Conference on Systems, Man and Cybernetics (January ed., Vol. 2014-January, pp. 2757-2763). [6974345] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/smc.2014.6974345