Scan-based attack against elliptic curve cryptosystems

Ryuta Nara, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    46 Citations (Scopus)

    Abstract

    Scan-based attacks are techniques to decipher a secret key using scanned data obtained from a cryptography circuit. Public-key cryptography, such as RSA and elliptic curve cryptosystem (ECC), is extensively used but conventional scan-based attacks cannot be applied to it, because it has a complicated algorithm as well as a complicated architecture. This paper proposes a scan-based attack which enables us to decipher a secret key in ECC. The proposed method is based on detecting intermediate values calculated in ECC. By monitoring the 1-bit sequence in the scan path, we can find out the register position specific to the intermediate value in it and we can know whether this intermediate value is calculated or not in the target ECC circuit. By using several intermediate values, we can decipher a secret key. The experimental results demonstrate that a secret key in a practical ECC circuit can be deciphered using 29 points over the elliptic curve E within 40 seconds.

    Original languageEnglish
    Title of host publicationProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC
    Pages407-412
    Number of pages6
    DOIs
    Publication statusPublished - 2010
    Event2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 - Taipei
    Duration: 2010 Jan 182010 Jan 21

    Other

    Other2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010
    CityTaipei
    Period10/1/1810/1/21

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    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Computer Science Applications
    • Computer Graphics and Computer-Aided Design

    Cite this

    Nara, R., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2010). Scan-based attack against elliptic curve cryptosystems. In Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC (pp. 407-412). [5419848] https://doi.org/10.1109/ASPDAC.2010.5419848