Abstract
Scan-based side channel attack on hardware implementations of cryptographic algorithms has shown its great security threat. Unlike existing scan-based attacks, in our work we observed that instead of the secret-related-registers, some non-secret registers also carry the potential of being misused to help a hacker to retrieve secret keys. In this paper, we first present a scan-based side channel attack method on AES by making use of the round counter registers, which are not paid attention to in previous works, to show the potential security threat in designs with scan chains. And then we discussed the issues of secure DFT requirements and proposed a secure scan scheme to preserve all the advantages and simplicities of traditional scan test, while significantly improve the security with ignorable design overhead, for crypto hardware implementations.
Original language | English |
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Pages (from-to) | 2338-2346 |
Number of pages | 9 |
Journal | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences |
Volume | E95-A |
Issue number | 12 |
DOIs | |
Publication status | Published - 2012 Dec |
Keywords
- Crypto implementation
- Scan-based side channel attack
- Security
- Testability
ASJC Scopus subject areas
- Signal Processing
- Computer Graphics and Computer-Aided Design
- Electrical and Electronic Engineering
- Applied Mathematics