Scan-based side-channel attack on Camellia cipher using scan signatures

Huiqian Hang, Mika Fujishiro, Hirokazu Kodera, Masao Yanagisawa, Nozomu Togawa

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    3 Citations (Scopus)

    Abstract

    Camellia, a block cipher jointly developed by Mitsubishi and NTT of Japan, is suitable for both software and hardware implementations and more secure than AES cipher. One of design-for-test techniques using scan chains is called scan-path test, in which testers can observe and control registers inside the LSI chip directly. Recently, scan-based side-channel attack is reported which retrieves the secret information from the cryptosystem using scan chains. In this paper, we propose a scan-based attack method on Camellia cipher using scan signatures. Our proposed method is based on equivalent transformation of the Camellia algorithm and key pattern reduction in order to retrieve the secret key. Experimental results show that our proposed method sucessfully retrieves its 128-bit secret key using 960 plaintexts if the scan chain is only connected to the Camellia cipher and also sucessfully retrieves its key on SASEBO-GII, which is a side-channel attack standard evaluation board.

    Original languageEnglish
    Title of host publicationIEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages252-255
    Number of pages4
    Volume2015-February
    EditionFebruary
    DOIs
    Publication statusPublished - 2015 Feb 5
    Event2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014 - Ishigaki Island, Okinawa, Japan
    Duration: 2014 Nov 172014 Nov 20

    Other

    Other2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014
    CountryJapan
    CityIshigaki Island, Okinawa
    Period14/11/1714/11/20

    Fingerprint

    Cryptography
    Hardware
    Side channel attack

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Hang, H., Fujishiro, M., Kodera, H., Yanagisawa, M., & Togawa, N. (2015). Scan-based side-channel attack on Camellia cipher using scan signatures. In IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS (February ed., Vol. 2015-February, pp. 252-255). [7032767] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APCCAS.2014.7032767

    Scan-based side-channel attack on Camellia cipher using scan signatures. / Hang, Huiqian; Fujishiro, Mika; Kodera, Hirokazu; Yanagisawa, Masao; Togawa, Nozomu.

    IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS. Vol. 2015-February February. ed. Institute of Electrical and Electronics Engineers Inc., 2015. p. 252-255 7032767.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Hang, H, Fujishiro, M, Kodera, H, Yanagisawa, M & Togawa, N 2015, Scan-based side-channel attack on Camellia cipher using scan signatures. in IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS. February edn, vol. 2015-February, 7032767, Institute of Electrical and Electronics Engineers Inc., pp. 252-255, 2014 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2014, Ishigaki Island, Okinawa, Japan, 14/11/17. https://doi.org/10.1109/APCCAS.2014.7032767
    Hang H, Fujishiro M, Kodera H, Yanagisawa M, Togawa N. Scan-based side-channel attack on Camellia cipher using scan signatures. In IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS. February ed. Vol. 2015-February. Institute of Electrical and Electronics Engineers Inc. 2015. p. 252-255. 7032767 https://doi.org/10.1109/APCCAS.2014.7032767
    Hang, Huiqian ; Fujishiro, Mika ; Kodera, Hirokazu ; Yanagisawa, Masao ; Togawa, Nozomu. / Scan-based side-channel attack on Camellia cipher using scan signatures. IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS. Vol. 2015-February February. ed. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 252-255
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