Scan-chain optimization algorithms for multiple scan-paths

Susumu Kobayashi, Masato Edahiro, Mikio Kubo

Research output: Contribution to conferencePaperpeer-review

4 Citations (Scopus)

Abstract

This paper presents an algorithm framework for the scan-chain optimization problem in multiple-scan design methodology. It also presents algorithms we propose based on the framework; these are the first algorithms ever proposed for multiple-scan designing. Experiments using actual design data show that, for ten scan-paths, our algorithms achieved a 90% reduction in scan-test time at the expense of a 7% total scan-path length increase as compared with the length of a single optimized scan-path.

Original languageEnglish
Pages301-306
Number of pages6
Publication statusPublished - 1998
Externally publishedYes
EventProceedings of the 1998 3rd Conference of the Asia and South Pacific Design Automation (ASP-DAC '98) - Yokohama, Jpn
Duration: 1998 Feb 101998 Feb 13

Other

OtherProceedings of the 1998 3rd Conference of the Asia and South Pacific Design Automation (ASP-DAC '98)
CityYokohama, Jpn
Period98/2/1098/2/13

ASJC Scopus subject areas

  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering

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