Scanning-tunneling-microscopy modification of nitrogen-passivated GaAs (001) surfaces on a nanometer scale

Makoto Kasu, Toshiki Makimoto, Naoki Kobayashi

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Abstract

Using scanning tunneling microscopy (STM), we perform nanometer-scale modifications on nitrogen (N)-passivated GaAs (001) surfaces. After the surface is passivated with nitrogen gas through a heated tungsten filament in an ultrahigh-vacuum chamber, STM modification is performed by increasing the tunnel current. A 200×200 nm2 square groove was successfully fabricated. The smallest grooves are 0.5 nm deep and 5 nm wide when sample bias is -3 V and tunnel current is 5 nA. The threshold current for modification is 5 nA for surfaces with N passivation, but more than 50 nA for surfaces without N passivation.

Original languageEnglish
Pages (from-to)1811-1813
Number of pages3
JournalApplied Physics Letters
Volume68
Issue number13
DOIs
Publication statusPublished - 1996 Dec 1

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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