Scientific exchanging meetings with overseas students for improvement of technical communication in English

Hiroshi Nishiguchi, Yoshihito Yagyu, Fumiko Ishinuki, Kenji Nakashima, Mitsuhiro Nakao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This report presents Global Engineering Course (GEC) efforts to date, including interactive events with an elementary school and a high school at the American Naval Base in Sasebo, and with visiting students from Xiamen (China), Singapore, and the U.S. In order to improve the students' ability to use English practically, communication classes between native speakers and small numbers of students (4 to 6) have been conducted at Sasebo Kosen for the past 5 years. For the purpose of improving students' ability, practical training time, opportunities to talk with native speakers such as exchange meetings, and usual classroom lectures should be held in unison. Students' English communication skills appear to be strengthened by so doing.

Original languageEnglish
Title of host publication2015 IEEE/SICE International Symposium on System Integration, SII 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages151-156
Number of pages6
ISBN (Electronic)9781467372428
DOIs
Publication statusPublished - 2016 Feb 10
Externally publishedYes
Event8th Annual IEEE/SICE International Symposium on System Integration, SII 2015 - Nagoya, Japan
Duration: 2015 Dec 112015 Dec 13

Other

Other8th Annual IEEE/SICE International Symposium on System Integration, SII 2015
CountryJapan
CityNagoya
Period15/12/1115/12/13

ASJC Scopus subject areas

  • Artificial Intelligence
  • Control and Systems Engineering

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  • Cite this

    Nishiguchi, H., Yagyu, Y., Ishinuki, F., Nakashima, K., & Nakao, M. (2016). Scientific exchanging meetings with overseas students for improvement of technical communication in English. In 2015 IEEE/SICE International Symposium on System Integration, SII 2015 (pp. 151-156). [7404970] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SII.2015.7404970