Scintillation yield in high pressure xenon and xenon doped with methane

K. N. Pushkin*, Nobuyuki Hasebe, S. Kobayashi, C. Tezuka, M. Mimura, T. Hosojima, M. N. Kobayashi, T. Doke, M. Miyajima, T. Miyachi, E. Shibamura, S. E. Ulin, V. V. Dmitrenko

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)

    Abstract

    Scintillation light and formation yields in pure xenon and xenon doped with various concentration of methane (0.2-2%) have been measured as a function of the reduced electric field (E/N) from 0 to 4×10 -18Vcm 2 at a pressure of 2.6 MPa. The measurements of photons and electrons have been made in gaseous xenon excited by 241Am alpha particles. High purity xenon was used to fill a high-pressure xenon chamber equipped with MgF 2 window coupled to a photomultiplier tube (PMT). The scintillation light in xenon-methane mixture is observed to decrease as the concentration of methane increases.

    Original languageEnglish
    Title of host publicationIEEE Nuclear Science Symposium Conference Record
    EditorsJ.A. Seibert
    Pages550-553
    Number of pages4
    Volume1
    Publication statusPublished - 2004
    Event2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors - Rome, Italy
    Duration: 2004 Oct 162004 Oct 22

    Other

    Other2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors
    Country/TerritoryItaly
    CityRome
    Period04/10/1604/10/22

    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Industrial and Manufacturing Engineering

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