Scintillation yield in high pressure xenon and xenon doped with methane

K. N. Pushkin, Nobuyuki Hasebe, S. Kobayashi, C. Tezuka, M. Mimura, T. Hosojima, M. N. Kobayashi, T. Doke, M. Miyajima, T. Miyachi, E. Shibamura, S. E. Ulin, V. V. Dmitrenko

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    4 Citations (Scopus)

    Abstract

    Scintillation light and formation yields in pure xenon and xenon doped with various concentration of methane (0.2-2%) have been measured as a function of the reduced electric field (E/N) from 0 to 4×10 -18Vcm 2 at a pressure of 2.6 MPa. The measurements of photons and electrons have been made in gaseous xenon excited by 241Am alpha particles. High purity xenon was used to fill a high-pressure xenon chamber equipped with MgF 2 window coupled to a photomultiplier tube (PMT). The scintillation light in xenon-methane mixture is observed to decrease as the concentration of methane increases.

    Original languageEnglish
    Title of host publicationIEEE Nuclear Science Symposium Conference Record
    EditorsJ.A. Seibert
    Pages550-553
    Number of pages4
    Volume1
    Publication statusPublished - 2004
    Event2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors - Rome, Italy
    Duration: 2004 Oct 162004 Oct 22

    Other

    Other2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors
    CountryItaly
    CityRome
    Period04/10/1604/10/22

    Fingerprint

    Xenon
    Scintillation
    Methane
    Alpha particles
    Photomultipliers
    Photons
    Electric fields
    Electrons

    ASJC Scopus subject areas

    • Computer Vision and Pattern Recognition
    • Industrial and Manufacturing Engineering

    Cite this

    Pushkin, K. N., Hasebe, N., Kobayashi, S., Tezuka, C., Mimura, M., Hosojima, T., ... Dmitrenko, V. V. (2004). Scintillation yield in high pressure xenon and xenon doped with methane. In J. A. Seibert (Ed.), IEEE Nuclear Science Symposium Conference Record (Vol. 1, pp. 550-553)

    Scintillation yield in high pressure xenon and xenon doped with methane. / Pushkin, K. N.; Hasebe, Nobuyuki; Kobayashi, S.; Tezuka, C.; Mimura, M.; Hosojima, T.; Kobayashi, M. N.; Doke, T.; Miyajima, M.; Miyachi, T.; Shibamura, E.; Ulin, S. E.; Dmitrenko, V. V.

    IEEE Nuclear Science Symposium Conference Record. ed. / J.A. Seibert. Vol. 1 2004. p. 550-553.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Pushkin, KN, Hasebe, N, Kobayashi, S, Tezuka, C, Mimura, M, Hosojima, T, Kobayashi, MN, Doke, T, Miyajima, M, Miyachi, T, Shibamura, E, Ulin, SE & Dmitrenko, VV 2004, Scintillation yield in high pressure xenon and xenon doped with methane. in JA Seibert (ed.), IEEE Nuclear Science Symposium Conference Record. vol. 1, pp. 550-553, 2004 Nuclear Science Symposium, Medical Imaging Conference, Symposium on Nuclear Power Systems and the 14th International Workshop on Room Temperature Semiconductor X- and Gamma- Ray Detectors, Rome, Italy, 04/10/16.
    Pushkin KN, Hasebe N, Kobayashi S, Tezuka C, Mimura M, Hosojima T et al. Scintillation yield in high pressure xenon and xenon doped with methane. In Seibert JA, editor, IEEE Nuclear Science Symposium Conference Record. Vol. 1. 2004. p. 550-553
    Pushkin, K. N. ; Hasebe, Nobuyuki ; Kobayashi, S. ; Tezuka, C. ; Mimura, M. ; Hosojima, T. ; Kobayashi, M. N. ; Doke, T. ; Miyajima, M. ; Miyachi, T. ; Shibamura, E. ; Ulin, S. E. ; Dmitrenko, V. V. / Scintillation yield in high pressure xenon and xenon doped with methane. IEEE Nuclear Science Symposium Conference Record. editor / J.A. Seibert. Vol. 1 2004. pp. 550-553
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    abstract = "Scintillation light and formation yields in pure xenon and xenon doped with various concentration of methane (0.2-2{\%}) have been measured as a function of the reduced electric field (E/N) from 0 to 4×10 -18Vcm 2 at a pressure of 2.6 MPa. The measurements of photons and electrons have been made in gaseous xenon excited by 241Am alpha particles. High purity xenon was used to fill a high-pressure xenon chamber equipped with MgF 2 window coupled to a photomultiplier tube (PMT). The scintillation light in xenon-methane mixture is observed to decrease as the concentration of methane increases.",
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    AU - Pushkin, K. N.

    AU - Hasebe, Nobuyuki

    AU - Kobayashi, S.

    AU - Tezuka, C.

    AU - Mimura, M.

    AU - Hosojima, T.

    AU - Kobayashi, M. N.

    AU - Doke, T.

    AU - Miyajima, M.

    AU - Miyachi, T.

    AU - Shibamura, E.

    AU - Ulin, S. E.

    AU - Dmitrenko, V. V.

    PY - 2004

    Y1 - 2004

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    AB - Scintillation light and formation yields in pure xenon and xenon doped with various concentration of methane (0.2-2%) have been measured as a function of the reduced electric field (E/N) from 0 to 4×10 -18Vcm 2 at a pressure of 2.6 MPa. The measurements of photons and electrons have been made in gaseous xenon excited by 241Am alpha particles. High purity xenon was used to fill a high-pressure xenon chamber equipped with MgF 2 window coupled to a photomultiplier tube (PMT). The scintillation light in xenon-methane mixture is observed to decrease as the concentration of methane increases.

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