Secure scan design with dynamically configurable connection

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    12 Citations (Scopus)

    Abstract

    Scan test is a powerful test technique which can control and observe the internal states of the circuit under test through scan chains. However, it has been reported that it's possible to retrieve secret keys from cryptographic LSIs through scan chains. Therefore new secure test methods are required to satisfy both testability and security requirements. In this paper, a secure scan design is proposed to achieve adequate security requirement as a countermeasure against scan-based attacks, while still maintain high testability like normal scan testing. In our method, the internal scan chain is divided into several sub chains, and the connection order of sub chains can be dynamically changed. In addition, how to decide the connection order of those sub chains so that it can't be identified by an attacker is also proposed in this paper. The proposed method is implemented on an AES circuit to show its effectiveness, and a security analysis is also given to show how the proposed approach can be used as a countermeasure against those known scan-based attacks.

    Original languageEnglish
    Title of host publicationProceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC
    PublisherIEEE Computer Society
    Pages256-262
    Number of pages7
    ISBN (Print)9780769551302
    DOIs
    Publication statusPublished - 2013
    Event19th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2013 - Vancouver, BC
    Duration: 2013 Dec 22013 Dec 4

    Other

    Other19th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2013
    CityVancouver, BC
    Period13/12/213/12/4

    Fingerprint

    Networks (circuits)
    Testing

    Keywords

    • AES
    • scan chain
    • scan-based attack
    • secure scan design

    ASJC Scopus subject areas

    • Computational Theory and Mathematics
    • Computer Science Applications
    • Hardware and Architecture
    • Software

    Cite this

    Atobe, Y., Shi, Y., Yanagisawa, M., & Togawa, N. (2013). Secure scan design with dynamically configurable connection. In Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC (pp. 256-262). [6820873] IEEE Computer Society. https://doi.org/10.1109/PRDC.2013.47

    Secure scan design with dynamically configurable connection. / Atobe, Yuta; Shi, Youhua; Yanagisawa, Masao; Togawa, Nozomu.

    Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC. IEEE Computer Society, 2013. p. 256-262 6820873.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Atobe, Y, Shi, Y, Yanagisawa, M & Togawa, N 2013, Secure scan design with dynamically configurable connection. in Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC., 6820873, IEEE Computer Society, pp. 256-262, 19th IEEE Pacific Rim International Symposium on Dependable Computing, PRDC 2013, Vancouver, BC, 13/12/2. https://doi.org/10.1109/PRDC.2013.47
    Atobe Y, Shi Y, Yanagisawa M, Togawa N. Secure scan design with dynamically configurable connection. In Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC. IEEE Computer Society. 2013. p. 256-262. 6820873 https://doi.org/10.1109/PRDC.2013.47
    Atobe, Yuta ; Shi, Youhua ; Yanagisawa, Masao ; Togawa, Nozomu. / Secure scan design with dynamically configurable connection. Proceedings of IEEE Pacific Rim International Symposium on Dependable Computing, PRDC. IEEE Computer Society, 2013. pp. 256-262
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