Selection of metrics for predicting the appropriate application of design patterns

Jonatan Hernandez, Atsuto Kubo, Hironori Washizaki, Yoshiaki Fukazawa

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    4 Citations (Scopus)

    Abstract

    Design patterns are known for their usefulness to solve recurrent problems. Design patterns are a way of transmitting knowledge and experience by using proven, high quality solutions. A problem that emerges when using design patterns is that it is not clear how to measure the impact that has its application on the source code. The relationships between metrics and design patterns is not clear. We propose an experiment for measuring the usefulness of metrics and their success in predicting correct usage of design patterns. With this experiment we will explore which metrics capture best the relationship of design patterns quality of the source code. By using those metrics we will make predictions about the correct usage of the design patterns. In this experiment the selected metrics were not a good predictor, however it is a starting point to explore more metrics and their relationships with design patterns.

    Original languageEnglish
    Title of host publicationACM International Conference Proceeding Series
    PublisherAssociation for Computing Machinery
    Volume2011-October
    ISBN (Print)9781450321099
    DOIs
    Publication statusPublished - 2011 Oct 5
    Event2nd Asian Conference on Pattern Languages of Programs, AsianPLoP 2011 - Tokyo, Japan
    Duration: 2011 Oct 5 → 2011 Oct 7

    Other

    Other2nd Asian Conference on Pattern Languages of Programs, AsianPLoP 2011
    CountryJapan
    CityTokyo
    Period11/10/5 → 11/10/7

    Keywords

    • Design patterns
    • Metrics

    ASJC Scopus subject areas

    • Human-Computer Interaction
    • Computer Networks and Communications
    • Computer Vision and Pattern Recognition
    • Software

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    Hernandez, J., Kubo, A., Washizaki, H., & Fukazawa, Y. (2011). Selection of metrics for predicting the appropriate application of design patterns. In ACM International Conference Proceeding Series (Vol. 2011-October). [a3] Association for Computing Machinery. https://doi.org/10.1145/2524629.2524633