Abstract
Design patterns are known for their usefulness to solve recurrent problems. Design patterns are a way of transmitting knowledge and experience by using proven, high quality solutions. A problem that emerges when using design patterns is that it is not clear how to measure the impact that has its application on the source code. The relationships between metrics and design patterns is not clear. We propose an experiment for measuring the usefulness of metrics and their success in predicting correct usage of design patterns. With this experiment we will explore which metrics capture best the relationship of design patterns quality of the source code. By using those metrics we will make predictions about the correct usage of the design patterns. In this experiment the selected metrics were not a good predictor, however it is a starting point to explore more metrics and their relationships with design patterns.
| Original language | English |
|---|---|
| Title of host publication | ACM International Conference Proceeding Series |
| Publisher | Association for Computing Machinery |
| Volume | 2011-October |
| ISBN (Print) | 9781450321099 |
| DOIs | |
| Publication status | Published - 2011 Oct 5 |
| Event | 2nd Asian Conference on Pattern Languages of Programs, AsianPLoP 2011 - Tokyo, Japan Duration: 2011 Oct 5 → 2011 Oct 7 |
Other
| Other | 2nd Asian Conference on Pattern Languages of Programs, AsianPLoP 2011 |
|---|---|
| Country | Japan |
| City | Tokyo |
| Period | 11/10/5 → 11/10/7 |
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Keywords
- Design patterns
- Metrics
ASJC Scopus subject areas
- Human-Computer Interaction
- Computer Networks and Communications
- Computer Vision and Pattern Recognition
- Software
Cite this
Selection of metrics for predicting the appropriate application of design patterns. / Hernandez, Jonatan; Kubo, Atsuto; Washizaki, Hironori; Fukazawa, Yoshiaki.
ACM International Conference Proceeding Series. Vol. 2011-October Association for Computing Machinery, 2011. a3.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Selection of metrics for predicting the appropriate application of design patterns
AU - Hernandez, Jonatan
AU - Kubo, Atsuto
AU - Washizaki, Hironori
AU - Fukazawa, Yoshiaki
PY - 2011/10/5
Y1 - 2011/10/5
N2 - Design patterns are known for their usefulness to solve recurrent problems. Design patterns are a way of transmitting knowledge and experience by using proven, high quality solutions. A problem that emerges when using design patterns is that it is not clear how to measure the impact that has its application on the source code. The relationships between metrics and design patterns is not clear. We propose an experiment for measuring the usefulness of metrics and their success in predicting correct usage of design patterns. With this experiment we will explore which metrics capture best the relationship of design patterns quality of the source code. By using those metrics we will make predictions about the correct usage of the design patterns. In this experiment the selected metrics were not a good predictor, however it is a starting point to explore more metrics and their relationships with design patterns.
AB - Design patterns are known for their usefulness to solve recurrent problems. Design patterns are a way of transmitting knowledge and experience by using proven, high quality solutions. A problem that emerges when using design patterns is that it is not clear how to measure the impact that has its application on the source code. The relationships between metrics and design patterns is not clear. We propose an experiment for measuring the usefulness of metrics and their success in predicting correct usage of design patterns. With this experiment we will explore which metrics capture best the relationship of design patterns quality of the source code. By using those metrics we will make predictions about the correct usage of the design patterns. In this experiment the selected metrics were not a good predictor, however it is a starting point to explore more metrics and their relationships with design patterns.
KW - Design patterns
KW - Metrics
UR - http://www.scopus.com/inward/record.url?scp=84940646188&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84940646188&partnerID=8YFLogxK
U2 - 10.1145/2524629.2524633
DO - 10.1145/2524629.2524633
M3 - Conference contribution
SN - 9781450321099
VL - 2011-October
BT - ACM International Conference Proceeding Series
PB - Association for Computing Machinery
ER -