Self-calibration of radially symmetric distortion by model selection

Jun Fujiki, Hideitsu Hino, Yumi Usami, Shotaro Akaho, Noboru Murata

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

For self-calibration of general radially symmetric distortion (RSD) of omnidirectional cameras such as fish-eye lenses, calibration parameters are usually estimated so that curved lines, which are supposed to be straight in the real-world, are mapped to straight lines in the calibrated image, which is assumed to be taken by an ideal pin-hole camera. In this paper, a method of calibrating RSD is introduced base on the notion of principal component analysis (PCA). In the proposed method, the distortion function, which maps a distorted image to an ideal pin-hole camera image, is assumed to be a linear combination of a certain class of basis functions, and an algorithm for solving its coefficients by using line patterns is given. Then a method of selecting good basis functions is proposed, which aims to realize appropriate calibration in practice. Experimental results for synthetic data and real images are presented to demonstrate the performance of our calibration method.

Original languageEnglish
Title of host publicationProceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Pages1812-1815
Number of pages4
DOIs
Publication statusPublished - 2010 Nov 18
Event2010 20th International Conference on Pattern Recognition, ICPR 2010 - Istanbul, Turkey
Duration: 2010 Aug 232010 Aug 26

Publication series

NameProceedings - International Conference on Pattern Recognition
ISSN (Print)1051-4651

Other

Other2010 20th International Conference on Pattern Recognition, ICPR 2010
CountryTurkey
CityIstanbul
Period10/8/2310/8/26

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition

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  • Cite this

    Fujiki, J., Hino, H., Usami, Y., Akaho, S., & Murata, N. (2010). Self-calibration of radially symmetric distortion by model selection. In Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010 (pp. 1812-1815). [5597210] (Proceedings - International Conference on Pattern Recognition). https://doi.org/10.1109/ICPR.2010.447