Self-healing metal wire using an electric field trapping of gold nanoparticles for flexible devices

Tomoya Koshi, Eiji Iwase

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We developed a self-healing metal wire using an electric field trapping of gold nanoparticles. A cracked metal wire on a stretchable substrate can get its conductivity again by the self-healing function. In this paper, first, we theoretically analyzed force acting on a nanoparticle and calculated a critical voltage which cause the electric field trapping. Next, we fabricated gold wires with artificially patterned cracks on a glass substrate and verified the self-healing function by experiments of a crack healing. Finally, we demonstrated the self-healing of a cracked metal wire on a stretchable substrate to show a usefulness of the self-healing for flexible devices.

    Original languageEnglish
    Title of host publicationProceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages81-84
    Number of pages4
    Volume2015-February
    EditionFebruary
    DOIs
    Publication statusPublished - 2015 Feb 26
    Event2015 28th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2015 - Estoril, Portugal
    Duration: 2015 Jan 182015 Jan 22

    Other

    Other2015 28th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2015
    CountryPortugal
    CityEstoril
    Period15/1/1815/1/22

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    ASJC Scopus subject areas

    • Electrical and Electronic Engineering
    • Mechanical Engineering
    • Condensed Matter Physics
    • Electronic, Optical and Magnetic Materials

    Cite this

    Koshi, T., & Iwase, E. (2015). Self-healing metal wire using an electric field trapping of gold nanoparticles for flexible devices. In Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS) (February ed., Vol. 2015-February, pp. 81-84). [7050891] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MEMSYS.2015.7050891