Semi-automatic incompatibility localization for re-engineered industrial software

Susumu Tokumoto, Kazunori Sakamoto, Kiyofumi Shimojo, Tadahiro Uehara, Hironori Washizaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

After a legacy system is re-engineered, it is important to perform compatibility testing so as to identify the differences and reduce the introduced bugs. We can first apply symbolic execution to obtain an exhaustive set of test cases, then use them to check the compatibility of the old system and the new one. However there may be a lot of failed test cases which are a mix of erroneous and allowable incompatibilities. To locate the causes of failures detected during the testing, we apply multiple statistical bug localization techniques. We are able to localize 90% of the incompatibilities in 10% of the code for an industrial application with around 20k lines by Tarantula. And we identify the characteristics of failure causes which are difficult to be detected by statistical bug localization.

Original languageEnglish
Title of host publicationProceedings - IEEE 7th International Conference on Software Testing, Verification and Validation, ICST 2014
PublisherIEEE Computer Society
Pages91-94
Number of pages4
ISBN (Print)9780769551852
DOIs
Publication statusPublished - 2014 Jan 1
Event7th IEEE International Conference on Software Testing, Verification and Validation, ICST 2014 - Cleveland, OH, United States
Duration: 2014 Mar 312014 Apr 4

Publication series

NameProceedings - IEEE 7th International Conference on Software Testing, Verification and Validation, ICST 2014

Conference

Conference7th IEEE International Conference on Software Testing, Verification and Validation, ICST 2014
CountryUnited States
CityCleveland, OH
Period14/3/3114/4/4

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Keywords

  • bug localization
  • compatibility testing
  • embedded system
  • fault localization
  • symbolic execution

ASJC Scopus subject areas

  • Software

Cite this

Tokumoto, S., Sakamoto, K., Shimojo, K., Uehara, T., & Washizaki, H. (2014). Semi-automatic incompatibility localization for re-engineered industrial software. In Proceedings - IEEE 7th International Conference on Software Testing, Verification and Validation, ICST 2014 (pp. 91-94). [6823869] (Proceedings - IEEE 7th International Conference on Software Testing, Verification and Validation, ICST 2014). IEEE Computer Society. https://doi.org/10.1109/ICST.2014.20