Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning

Jacqueline Yan, Masahiro Oroku, Youhei Yamaguchi, Takashi Yamanaka, Yoshio Kamiya, Taikan Suehara, Sachio Komamiya, Toshiyuki Okugi, Nobuhiro Terunuma, Toshiaki Tauchi, Sakae Araki, Junji Urakawa

Research output: Contribution to journalConference article

1 Citation (Scopus)

Abstract

A novel final focus system design featuring the Local Chromaticity Correction scheme has beenproposed for ILC. This is to be verified at ATF2, a test facility for ILC, through focusing an e-beam down to the design vertical beam size ("σy") of 37 nm. Shintake Beam Size Monitor ("IPBSM"),installed at the virtual interaction point of ATF2, is the only existing device capable of measuring σy below 100 nm, making it indispensable for achieving the goals of ATF2 and a strong candidate for R&D at future linear colliders. This is attributed to its ingenious technique of scanning the phase oflaser interference fringes relative to the e-beam. Beam sizes are derived from the resulting Compton signal modulation measured by a downstream detector. Having been upgraded in a variety of ways since its first debut at FFTB, Shintake Monitor is capable of measuring a wide range of σy from 25 nm to 6 μm with better than 10% resolution. This paper describes the system's design, role in beam tuning, and various hardware upgrades to further improve its performance.

Original languageEnglish
Pages (from-to)1989-1996
Number of pages8
JournalPhysics Procedia
Volume37
DOIs
Publication statusPublished - 2012 Jan 1
Externally publishedYes
Event2nd International Conference on Technology and Instrumentation in Particle Physics, TIPP 2011 - Chicago, United States
Duration: 2011 Jun 92011 Jun 14

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monitors
tuning
systems engineering
test facilities
hardware
interference
modulation
scanning
detectors
interactions

Keywords

  • Accelerator
  • Beam size
  • Electron linear collider
  • ILC
  • Laser interference
  • Luminosity

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Yan, J., Oroku, M., Yamaguchi, Y., Yamanaka, T., Kamiya, Y., Suehara, T., ... Urakawa, J. (2012). Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning. Physics Procedia, 37, 1989-1996. https://doi.org/10.1016/j.phpro.2012.02.522

Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning. / Yan, Jacqueline; Oroku, Masahiro; Yamaguchi, Youhei; Yamanaka, Takashi; Kamiya, Yoshio; Suehara, Taikan; Komamiya, Sachio; Okugi, Toshiyuki; Terunuma, Nobuhiro; Tauchi, Toshiaki; Araki, Sakae; Urakawa, Junji.

In: Physics Procedia, Vol. 37, 01.01.2012, p. 1989-1996.

Research output: Contribution to journalConference article

Yan, J, Oroku, M, Yamaguchi, Y, Yamanaka, T, Kamiya, Y, Suehara, T, Komamiya, S, Okugi, T, Terunuma, N, Tauchi, T, Araki, S & Urakawa, J 2012, 'Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning', Physics Procedia, vol. 37, pp. 1989-1996. https://doi.org/10.1016/j.phpro.2012.02.522
Yan J, Oroku M, Yamaguchi Y, Yamanaka T, Kamiya Y, Suehara T et al. Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning. Physics Procedia. 2012 Jan 1;37:1989-1996. https://doi.org/10.1016/j.phpro.2012.02.522
Yan, Jacqueline ; Oroku, Masahiro ; Yamaguchi, Youhei ; Yamanaka, Takashi ; Kamiya, Yoshio ; Suehara, Taikan ; Komamiya, Sachio ; Okugi, Toshiyuki ; Terunuma, Nobuhiro ; Tauchi, Toshiaki ; Araki, Sakae ; Urakawa, Junji. / Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning. In: Physics Procedia. 2012 ; Vol. 37. pp. 1989-1996.
@article{a3d88d1af6124dd282b04ed72b8506de,
title = "Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning",
abstract = "A novel final focus system design featuring the Local Chromaticity Correction scheme has beenproposed for ILC. This is to be verified at ATF2, a test facility for ILC, through focusing an e-beam down to the design vertical beam size ({"}σy{"}) of 37 nm. Shintake Beam Size Monitor ({"}IPBSM{"}),installed at the virtual interaction point of ATF2, is the only existing device capable of measuring σy below 100 nm, making it indispensable for achieving the goals of ATF2 and a strong candidate for R&D at future linear colliders. This is attributed to its ingenious technique of scanning the phase oflaser interference fringes relative to the e-beam. Beam sizes are derived from the resulting Compton signal modulation measured by a downstream detector. Having been upgraded in a variety of ways since its first debut at FFTB, Shintake Monitor is capable of measuring a wide range of σy from 25 nm to 6 μm with better than 10{\%} resolution. This paper describes the system's design, role in beam tuning, and various hardware upgrades to further improve its performance.",
keywords = "Accelerator, Beam size, Electron linear collider, ILC, Laser interference, Luminosity",
author = "Jacqueline Yan and Masahiro Oroku and Youhei Yamaguchi and Takashi Yamanaka and Yoshio Kamiya and Taikan Suehara and Sachio Komamiya and Toshiyuki Okugi and Nobuhiro Terunuma and Toshiaki Tauchi and Sakae Araki and Junji Urakawa",
year = "2012",
month = "1",
day = "1",
doi = "10.1016/j.phpro.2012.02.522",
language = "English",
volume = "37",
pages = "1989--1996",
journal = "Physics Procedia",
issn = "1875-3884",
publisher = "Elsevier BV",

}

TY - JOUR

T1 - Shintake Monitor Nanometer Beam Size Measurement and Beam Tuning

AU - Yan, Jacqueline

AU - Oroku, Masahiro

AU - Yamaguchi, Youhei

AU - Yamanaka, Takashi

AU - Kamiya, Yoshio

AU - Suehara, Taikan

AU - Komamiya, Sachio

AU - Okugi, Toshiyuki

AU - Terunuma, Nobuhiro

AU - Tauchi, Toshiaki

AU - Araki, Sakae

AU - Urakawa, Junji

PY - 2012/1/1

Y1 - 2012/1/1

N2 - A novel final focus system design featuring the Local Chromaticity Correction scheme has beenproposed for ILC. This is to be verified at ATF2, a test facility for ILC, through focusing an e-beam down to the design vertical beam size ("σy") of 37 nm. Shintake Beam Size Monitor ("IPBSM"),installed at the virtual interaction point of ATF2, is the only existing device capable of measuring σy below 100 nm, making it indispensable for achieving the goals of ATF2 and a strong candidate for R&D at future linear colliders. This is attributed to its ingenious technique of scanning the phase oflaser interference fringes relative to the e-beam. Beam sizes are derived from the resulting Compton signal modulation measured by a downstream detector. Having been upgraded in a variety of ways since its first debut at FFTB, Shintake Monitor is capable of measuring a wide range of σy from 25 nm to 6 μm with better than 10% resolution. This paper describes the system's design, role in beam tuning, and various hardware upgrades to further improve its performance.

AB - A novel final focus system design featuring the Local Chromaticity Correction scheme has beenproposed for ILC. This is to be verified at ATF2, a test facility for ILC, through focusing an e-beam down to the design vertical beam size ("σy") of 37 nm. Shintake Beam Size Monitor ("IPBSM"),installed at the virtual interaction point of ATF2, is the only existing device capable of measuring σy below 100 nm, making it indispensable for achieving the goals of ATF2 and a strong candidate for R&D at future linear colliders. This is attributed to its ingenious technique of scanning the phase oflaser interference fringes relative to the e-beam. Beam sizes are derived from the resulting Compton signal modulation measured by a downstream detector. Having been upgraded in a variety of ways since its first debut at FFTB, Shintake Monitor is capable of measuring a wide range of σy from 25 nm to 6 μm with better than 10% resolution. This paper describes the system's design, role in beam tuning, and various hardware upgrades to further improve its performance.

KW - Accelerator

KW - Beam size

KW - Electron linear collider

KW - ILC

KW - Laser interference

KW - Luminosity

UR - http://www.scopus.com/inward/record.url?scp=85038212512&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85038212512&partnerID=8YFLogxK

U2 - 10.1016/j.phpro.2012.02.522

DO - 10.1016/j.phpro.2012.02.522

M3 - Conference article

VL - 37

SP - 1989

EP - 1996

JO - Physics Procedia

JF - Physics Procedia

SN - 1875-3884

ER -