Si - O - Si strained bond and paramagnetic defect centers induced by mechanical fracturing in amorphous SiO2

Shuji Munekuni*, Nobuyuki Dohguchi, Hiroyuki Nishikawa, Yoshimichi Ohki, Kaya Nagasawa, Yoshimasa Hama

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

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Physics & Astronomy