Simple series form formula of BER performance of M-ary QAM/OFDM signals over nonlinear fading channels

Yuichiro Goto, Akihiro Yamakita, Fumiaki Maehara

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    This paper proposes a simple series form formula of the bit error rate (BER) for M-ary QAM/OFDM signals under nonlinear fading channels. In the proposed derivation, the effect of the nonlinear distortion due to the soft envelope limiter is approximated by the additive Gaussian noise with the variance equal to the power of the clipped portion of the composite waveform. Since the BER is represented by the simple series form formula, the proposed approach frees us from the time-consuming computer simulations. Moreover, the proposed formula is applicable to arbitrary M-ary quadrature amplitude modulations (QAM). The validity of the proposed approach is confirmed by the agreement with the computer simulation results with parameters of the input back-off (IBO) and average CNR.

    Original languageEnglish
    Title of host publicationLecture Notes in Electrical Engineering
    Pages281-290
    Number of pages10
    Volume41 LNEE
    DOIs
    Publication statusPublished - 2009
    Event7th International Workshop on Multi-Carrier Systems and Solutions, MC-SS 2009 - Herrsching
    Duration: 2009 May 52009 May 6

    Publication series

    NameLecture Notes in Electrical Engineering
    Volume41 LNEE
    ISSN (Print)18761100
    ISSN (Electronic)18761119

    Other

    Other7th International Workshop on Multi-Carrier Systems and Solutions, MC-SS 2009
    CityHerrsching
    Period09/5/509/5/6

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    ASJC Scopus subject areas

    • Industrial and Manufacturing Engineering

    Cite this

    Goto, Y., Yamakita, A., & Maehara, F. (2009). Simple series form formula of BER performance of M-ary QAM/OFDM signals over nonlinear fading channels. In Lecture Notes in Electrical Engineering (Vol. 41 LNEE, pp. 281-290). (Lecture Notes in Electrical Engineering; Vol. 41 LNEE). https://doi.org/10.1007/978-90-481-2530-2_27