Simulation of particle size measurement with LIBS

Muneaki Wakamatsu, Alexander Andreev, Toshitsugu Ueda

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    The problem of small solid particle size and material detection is important for industrial and environmental applications. Previous investigations have shown the possibility of using the laser breakdown method to address the first issue; the sensitivity of this method is a thousand times higher than that of conventional methods. However, for small particle sizes, the damage threshold of the solid target in this case is very close to the breakdown point of pure gas. After breakdown, there is a small volume of dense hot plasma that emits radiation. We analyzed this radiation especially at the late stage using an analytical model and simulation code, and found that the emission intensity varied depending on the laser type and plasma parameters including initial particle size.

    Original languageEnglish
    Title of host publicationIECON Proceedings (Industrial Electronics Conference)
    Pages3170-3175
    Number of pages6
    DOIs
    Publication statusPublished - 2006
    EventIECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Paris
    Duration: 2006 Nov 62006 Nov 10

    Other

    OtherIECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics
    CityParis
    Period06/11/606/11/10

    Fingerprint

    Particle size
    Plasmas
    Radiation
    Lasers
    Analytical models
    Gases

    Keywords

    • Laser breakdown in gas
    • Laser plasma line emission
    • Laser pulse
    • Small solid particle size

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

    Cite this

    Wakamatsu, M., Andreev, A., & Ueda, T. (2006). Simulation of particle size measurement with LIBS. In IECON Proceedings (Industrial Electronics Conference) (pp. 3170-3175). [4153324] https://doi.org/10.1109/IECON.2006.347989

    Simulation of particle size measurement with LIBS. / Wakamatsu, Muneaki; Andreev, Alexander; Ueda, Toshitsugu.

    IECON Proceedings (Industrial Electronics Conference). 2006. p. 3170-3175 4153324.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Wakamatsu, M, Andreev, A & Ueda, T 2006, Simulation of particle size measurement with LIBS. in IECON Proceedings (Industrial Electronics Conference)., 4153324, pp. 3170-3175, IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics, Paris, 06/11/6. https://doi.org/10.1109/IECON.2006.347989
    Wakamatsu M, Andreev A, Ueda T. Simulation of particle size measurement with LIBS. In IECON Proceedings (Industrial Electronics Conference). 2006. p. 3170-3175. 4153324 https://doi.org/10.1109/IECON.2006.347989
    Wakamatsu, Muneaki ; Andreev, Alexander ; Ueda, Toshitsugu. / Simulation of particle size measurement with LIBS. IECON Proceedings (Industrial Electronics Conference). 2006. pp. 3170-3175
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