Simulation of thermal-neutron-induced single-event upset using particle and heavy-ion transport code system

Yutaka Arita, Koji Niita, Yuji Kihara, Junich Mitsuhasi, Mikio Takai, Izumi Ogawa, Tadafumi Kishimoto, Tsutomu Yoshihara

    Research output: Contribution to journalArticle

    Abstract

    The simulation of a thermal-neutron-induced single-event upset (SEU) was performed on a 0.4-μm-design-rule 4 Mbit static random access memory (SRAM) using particle and heavy-ion transport code system (PHITS). The SEU rates obtained by the simulation were in very good agreement with the result of experiments. PHITS is a useful tool for simulating SEUs in semiconductor devices. To further improve the accuracy of the simulation, additional methods for tallying the energy deposition are required for PHITS.

    Original languageEnglish
    Pages (from-to)3377-3379
    Number of pages3
    JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    Volume46
    Issue number6 A
    DOIs
    Publication statusPublished - 2007 Jun 6

    Keywords

    • PHITS
    • Simulation
    • Single-event upset
    • SRAM
    • Thermal neutron

    ASJC Scopus subject areas

    • Physics and Astronomy (miscellaneous)

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