Abstract
The second harmonic of a picosecond Nd:YAG laser was used to nonresonantly ionize Xe atoms in vacuum. The spatial distribution of the produced ions was observed by our ion-imaging method. Time of flight spectrum of the produced ions was also measured simultaneously. Xe2+ and Xe3+ ions were detected around the center of the ionization volume. The produced amount of multiply charged ions decreased rapidly with the distance from the center of ionization volume comparing to that of Xe+ ions. The present method can be applied for the simultaneous measurement of total and partial pressure.
Original language | English |
---|---|
Pages (from-to) | 553-555 |
Number of pages | 3 |
Journal | Vacuum |
Volume | 47 |
Issue number | 6-8 |
Publication status | Published - 1996 Jan 1 |
Externally published | Yes |
Keywords
- Imaging
- Laser ionization
- Mass spectrum
- Pressure measurement
- Time of flight (TOF)
ASJC Scopus subject areas
- Instrumentation
- Condensed Matter Physics
- Surfaces, Coatings and Films