Single-atom coherent field electron emitters for practical application to electron microscopy: Buildup controllability, self-repairing function and demountable characteristic

E. Rokuta*, T. Itagaki, T. Ishikawa, B. L. Cho, H. S. Kuo, T. T. Tsong, C. Oshima

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

33 Citations (Scopus)

Abstract

We have fabricated single-atom field emission (FE) tips by annealing Rh-deposited W tips at 900 K, and the FE characteristics were investigated. Due to the formation of the nanotips, the electron beams were confined in a semi-cone angle of 3°, an indication quite different from the conventional FE beams. In repairing-function test where the FE nanotips were intentionally destroyed beforehand, they recovered the peculiar FE characteristics by means of feasible low temperature annealing. Finally, we found that the present nanotips equipped the capability of recovering the unique FE properties even after an exposure to the air. These characteristics are significantly relevant to the practical applications to electron-optics instruments.

Original languageEnglish
Pages (from-to)3686-3691
Number of pages6
JournalApplied Surface Science
Volume252
Issue number10
DOIs
Publication statusPublished - 2006 Mar 15

Keywords

  • Emountablity
  • Filed emission
  • Nanotip
  • Self-repairing functions

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

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