We have developed a technique for detecting single-ions that uses CR-39 plastic. Chemical etching of the plastic enables us to visualize both the incident sites and the existence of the single-ion incidences as etch pits. Using this technique, we obtained a singularity rate of 88.3%.
|Number of pages||3|
|Journal||Review of Scientific Instruments|
|Publication status||Published - 1999 Dec|
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