Abstract
We have developed a technique for detecting single-ions that uses CR-39 plastic. Chemical etching of the plastic enables us to visualize both the incident sites and the existence of the single-ion incidences as etch pits. Using this technique, we obtained a singularity rate of 88.3%.
Original language | English |
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Pages (from-to) | 4536-4538 |
Number of pages | 3 |
Journal | Review of Scientific Instruments |
Volume | 70 |
Issue number | 12 |
DOIs | |
Publication status | Published - 1999 Dec |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation