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Small delay fault model for intra-gate resistive open defects
Masayuki Arai*, Akifumi Suto, Katsuyuki Nakano, Michihiro Shintani, Kazuhiko Iwasaki, Kazumi Hatayama, Takashi Aikyo
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
10
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(Scopus)