Small delay fault model for intra-gate resistive open defects

Masayuki Arai*, Akifumi Suto, Katsuyuki Nakano, Michihiro Shintani, Kazuhiko Iwasaki, Kazumi Hatayama, Takashi Aikyo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Citations (Scopus)

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Engineering & Materials Science