SOBINMF for automatic removal of ocular artifacts from the EEG

Hirohisa Tsubakida; Yumie Ono; Atsushi Ishiyama

doi:10.1541/ieejeiss.135.954

SOBINMF for automatic removal of ocular artifacts from the EEG

Hirohisa Tsubakida, Yumie Ono, Atsushi Ishiyama

Research output: Contribution to journal › Article

Abstract

This paper introduces a novel method to automatically remove electro-oculogram (EOG) from electroencephalogram (EEG) using second-order blind identification (SOBI) and nonnegative matrix factorization (NMF). To demonstrate the effectiveness of the proposed method, we applied SOBI, NMF, or combined SOBI and NMF (SOBINMF) to the EEG data during motor imagery task in which participants imagined moving their left or right hand. Ocular artifacts were removed more effectively in our proposed SOBINMF method compared to SOBI or NMF alone.

Original language	English
Pages (from-to)	954-962
Number of pages	9
Journal	IEEJ Transactions on Electronics, Information and Systems
Volume	135
Issue number	8
DOIs	https://doi.org/10.1541/ieejeiss.135.954
Publication status	Published - 2015 Aug 1

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Keywords

Electro-oculogram artifact
Electroencephalogram
Nonnegative matrix factorization
Second order blind identification

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Tsubakida, H., Ono, Y., & Ishiyama, A. (2015). SOBINMF for automatic removal of ocular artifacts from the EEG. IEEJ Transactions on Electronics, Information and Systems, 135(8), 954-962. https://doi.org/10.1541/ieejeiss.135.954

@article{cbbe616c52d942b682694f9b1f1b116b,

title = "SOBINMF for automatic removal of ocular artifacts from the EEG",

abstract = "This paper introduces a novel method to automatically remove electro-oculogram (EOG) from electroencephalogram (EEG) using second-order blind identification (SOBI) and nonnegative matrix factorization (NMF). To demonstrate the effectiveness of the proposed method, we applied SOBI, NMF, or combined SOBI and NMF (SOBINMF) to the EEG data during motor imagery task in which participants imagined moving their left or right hand. Ocular artifacts were removed more effectively in our proposed SOBINMF method compared to SOBI or NMF alone.",

keywords = "Electro-oculogram artifact, Electroencephalogram, Nonnegative matrix factorization, Second order blind identification",

author = "Hirohisa Tsubakida and Yumie Ono and Atsushi Ishiyama",

year = "2015",

month = aug,

day = "1",

doi = "10.1541/ieejeiss.135.954",

language = "English",

volume = "135",

pages = "954--962",

journal = "IEEJ Transactions on Electronics, Information and Systems",

issn = "0385-4221",

publisher = "The Institute of Electrical Engineers of Japan",

number = "8",

}

TY - JOUR

T1 - SOBINMF for automatic removal of ocular artifacts from the EEG

AU - Tsubakida, Hirohisa

AU - Ono, Yumie

AU - Ishiyama, Atsushi

PY - 2015/8/1

Y1 - 2015/8/1

N2 - This paper introduces a novel method to automatically remove electro-oculogram (EOG) from electroencephalogram (EEG) using second-order blind identification (SOBI) and nonnegative matrix factorization (NMF). To demonstrate the effectiveness of the proposed method, we applied SOBI, NMF, or combined SOBI and NMF (SOBINMF) to the EEG data during motor imagery task in which participants imagined moving their left or right hand. Ocular artifacts were removed more effectively in our proposed SOBINMF method compared to SOBI or NMF alone.

AB - This paper introduces a novel method to automatically remove electro-oculogram (EOG) from electroencephalogram (EEG) using second-order blind identification (SOBI) and nonnegative matrix factorization (NMF). To demonstrate the effectiveness of the proposed method, we applied SOBI, NMF, or combined SOBI and NMF (SOBINMF) to the EEG data during motor imagery task in which participants imagined moving their left or right hand. Ocular artifacts were removed more effectively in our proposed SOBINMF method compared to SOBI or NMF alone.

KW - Electro-oculogram artifact

KW - Electroencephalogram

KW - Nonnegative matrix factorization

KW - Second order blind identification

UR - http://www.scopus.com/inward/record.url?scp=84938914186&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84938914186&partnerID=8YFLogxK

U2 - 10.1541/ieejeiss.135.954

DO - 10.1541/ieejeiss.135.954

M3 - Article

AN - SCOPUS:84938914186

VL - 135

SP - 954

EP - 962

JO - IEEJ Transactions on Electronics, Information and Systems

JF - IEEJ Transactions on Electronics, Information and Systems

SN - 0385-4221

IS - 8

ER -

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10.1541/ieejeiss.135.954