SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM.

Masahiko Yoshimoto, Kenji Anami, Hirofumi Shinohara, Yoshihiro Hirata, Tsutomu Yoshihara, Takao Nakano

Research output: Contribution to conferencePaper

9 Citations (Scopus)
Original languageEnglish
Pages69-73
Number of pages5
Publication statusPublished - 1983 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Yoshimoto, M., Anami, K., Shinohara, H., Hirata, Y., Yoshihara, T., & Nakano, T. (1983). SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM.. 69-73.