SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM.

Masahiko Yoshimoto, Kenji Anami, Hirofumi Shinohara, Yoshihiro Hirata, Tsutomu Yoshihara, Takao Nakano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the Conference on Solid State Devices
Place of PublicationTokyo, Jpn
PublisherJapanese Journal of Applied Physics (v 22 1983 Suppl 22-1)
Pages69-73
Number of pages5
Publication statusPublished - 1983
Externally publishedYes

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Random access storage
Error analysis

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Yoshimoto, M., Anami, K., Shinohara, H., Hirata, Y., Yoshihara, T., & Nakano, T. (1983). SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM. In Proceedings of the Conference on Solid State Devices (pp. 69-73). Tokyo, Jpn: Japanese Journal of Applied Physics (v 22 1983 Suppl 22-1).

SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM. / Yoshimoto, Masahiko; Anami, Kenji; Shinohara, Hirofumi; Hirata, Yoshihiro; Yoshihara, Tsutomu; Nakano, Takao.

Proceedings of the Conference on Solid State Devices. Tokyo, Jpn : Japanese Journal of Applied Physics (v 22 1983 Suppl 22-1), 1983. p. 69-73.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yoshimoto, M, Anami, K, Shinohara, H, Hirata, Y, Yoshihara, T & Nakano, T 1983, SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM. in Proceedings of the Conference on Solid State Devices. Japanese Journal of Applied Physics (v 22 1983 Suppl 22-1), Tokyo, Jpn, pp. 69-73.
Yoshimoto M, Anami K, Shinohara H, Hirata Y, Yoshihara T, Nakano T. SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM. In Proceedings of the Conference on Solid State Devices. Tokyo, Jpn: Japanese Journal of Applied Physics (v 22 1983 Suppl 22-1). 1983. p. 69-73
Yoshimoto, Masahiko ; Anami, Kenji ; Shinohara, Hirofumi ; Hirata, Yoshihiro ; Yoshihara, Tsutomu ; Nakano, Takao. / SOFT ERROR ANALYSIS OF FULLY STATIC MOS RAM. Proceedings of the Conference on Solid State Devices. Tokyo, Jpn : Japanese Journal of Applied Physics (v 22 1983 Suppl 22-1), 1983. pp. 69-73
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