Soft error tolerant latch designs with low power consumption (invited paper)

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

As semiconductor technology continues scaling down, the reliability issue has become much more critical than ever before. Unlike traditional hard-errors caused by permanent physical damage which can't be recovered in field, soft errors are caused by radiation or voltage/current fluctuations that lead to transient changes on internal node states, thus they can be viewed as temporary errors. However, due to the unpredictable occurrence of soft errors, it is desirable to develop soft error tolerant designs. For this reason, soft error tolerant design techniques have gained great research interest. In this paper, we will explain the soft error mechanism and then review the existing soft error tolerant design techniques with particular emphasis on SEH family because they can achieve low power consumption and small performance overhead as well.

Original languageEnglish
Title of host publicationProceedings - 2017 IEEE 12th International Conference on ASIC, ASICON 2017
EditorsYajie Qin, Zhiliang Hong, Ting-Ao Tang
PublisherIEEE Computer Society
Pages52-55
Number of pages4
ISBN (Electronic)9781509066247
DOIs
Publication statusPublished - 2017 Jul 1
Event12th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2017 - Guiyang, China
Duration: 2017 Oct 252017 Oct 28

Publication series

NameProceedings of International Conference on ASIC
Volume2017-October
ISSN (Print)2162-7541
ISSN (Electronic)2162-755X

Other

Other12th IEEE International Conference on Advanced Semiconductor Integrated Circuits, ASICON 2017
Country/TerritoryChina
CityGuiyang
Period17/10/2517/10/28

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Soft error tolerant latch designs with low power consumption (invited paper)'. Together they form a unique fingerprint.

Cite this