Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films

T. Yokoya, T. Nakamura, T. Matushita, T. Muro, H. Okazaki, M. Arita, K. Shimada, H. Namatame, M. Taniguchi, Y. Takano, M. Nagao, T. Takenouchi, Hiroshi Kawarada, T. Oguchi

    Research output: Contribution to journalArticle

    9 Citations (Scopus)

    Abstract

    We have performed soft X-ray angle-resolved photoemission spectroscopy (SXARPES) of microwave plasma-assisted chemical vapor deposition diamond films with different B concentrations in order to study the origin of the metallic behavior of superconducting diamond. SXARPES results clearly show valence band dispersions with a bandwidth of ∼23 eV and with a top of the valence band at gamma point in the Brillouin zone, which are consistent with the calculated valence band dispersions of pure diamond. Boron concentration-dependent band dispersions near the Fermi level (EF) exhibit a systematic shift of EF, indicating depopulation of electrons due to hole doping. These SXARPES results indicate that diamond bands retain for heavy boron doping and holes in the diamond band are responsible for the metallic states leading to superconductivity at low temperature. A high-resolution photoemission spectroscopy spectrum near EF of a heavily boron-doped diamond superconductor is also presented.

    Original languageEnglish
    Pages (from-to)12-16
    Number of pages5
    JournalScience and Technology of Advanced Materials
    Volume7
    Issue numberSUPPL. 1
    DOIs
    Publication statusPublished - 2006

    Fingerprint

    Diamond
    Superconducting films
    Boron
    Diamond films
    Photoelectron spectroscopy
    Diamonds
    X rays
    Valence bands
    Dispersions
    Doping (additives)
    Superconductivity
    Fermi level
    Superconducting materials
    Chemical vapor deposition
    Microwaves
    Plasmas
    Bandwidth
    Electrons
    Temperature

    Keywords

    • Angle-resolved photoemission
    • Band structure
    • Diamond
    • Heavily boron doped
    • Hole
    • Superconductivity

    ASJC Scopus subject areas

    • Materials Science(all)

    Cite this

    Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films. / Yokoya, T.; Nakamura, T.; Matushita, T.; Muro, T.; Okazaki, H.; Arita, M.; Shimada, K.; Namatame, H.; Taniguchi, M.; Takano, Y.; Nagao, M.; Takenouchi, T.; Kawarada, Hiroshi; Oguchi, T.

    In: Science and Technology of Advanced Materials, Vol. 7, No. SUPPL. 1, 2006, p. 12-16.

    Research output: Contribution to journalArticle

    Yokoya, T, Nakamura, T, Matushita, T, Muro, T, Okazaki, H, Arita, M, Shimada, K, Namatame, H, Taniguchi, M, Takano, Y, Nagao, M, Takenouchi, T, Kawarada, H & Oguchi, T 2006, 'Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films', Science and Technology of Advanced Materials, vol. 7, no. SUPPL. 1, pp. 12-16. https://doi.org/10.1016/j.stam.2005.11.012
    Yokoya, T. ; Nakamura, T. ; Matushita, T. ; Muro, T. ; Okazaki, H. ; Arita, M. ; Shimada, K. ; Namatame, H. ; Taniguchi, M. ; Takano, Y. ; Nagao, M. ; Takenouchi, T. ; Kawarada, Hiroshi ; Oguchi, T. / Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films. In: Science and Technology of Advanced Materials. 2006 ; Vol. 7, No. SUPPL. 1. pp. 12-16.
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    AU - Shimada, K.

    AU - Namatame, H.

    AU - Taniguchi, M.

    AU - Takano, Y.

    AU - Nagao, M.

    AU - Takenouchi, T.

    AU - Kawarada, Hiroshi

    AU - Oguchi, T.

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