Soft X-ray emission spectra of argon atoms doped in solid matrices

Yasuji Muramatsu, Tomoyuki Yamamoto, Jonathan D. Denlinger, Rupert C.C. Perera

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Soft X-ray emission spectra in the Ar L region of various solid substrates doped with Ar atoms were measured to investigate the chemical states of the Ar atoms in the solid matrices. Ar ions were implanted into the solid matrices of Si(1 1 1), SiO2, highly oriented pyrolytic graphite (HOPG), Ti, Cr, Ni, and Cu with an acceleration voltage of 5 kV at room temperature. Soft X-ray emission spectra in the Ar L region were measured using synchrotron radiation. Low-energy tailing was observed at the L3-M1 and L 2-M1 X-ray emission peaks in Ar-doped transition metals. The density of states (DOS) of the Ar 3s orbitals indicated that the low-energy tailed DOS can be formed by hybridization with 3d orbitals in the overpressurized Ar clusters.

Original languageEnglish
Pages (from-to)799-802
Number of pages4
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
DOIs
Publication statusPublished - 2005 Jun 1

Keywords

  • Argon
  • Soft X-ray
  • Synchrotron radiation
  • X-ray emission

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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