Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)


    Soft X-ray exposure effects on CH3NH3PbI3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PbI3 to PbI2 due to evaporation of methylammonium iodide.

    Original languageEnglish
    Title of host publication2016 IEEE 43rd Photovoltaic Specialists Conference, PVSC 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Number of pages4
    ISBN (Electronic)9781509027248
    Publication statusPublished - 2016 Nov 18
    Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
    Duration: 2016 Jun 52016 Jun 10


    Other43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
    Country/TerritoryUnited States


    • CHNHPbI
    • organic-inorganic hybrid perovskite
    • PbI
    • X-ray irradiation

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering


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