Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Soft X-ray exposure effects on CH3NH3PM3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PM3 to PbI2 due to evaporation of methylammonium iodide.

    Original languageEnglish
    Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages1-4
    Number of pages4
    ISBN (Electronic)9781509056057
    DOIs
    Publication statusPublished - 2018 May 25
    Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
    Duration: 2017 Jun 252017 Jun 30

    Other

    Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
    CountryUnited States
    CityWashington
    Period17/6/2517/6/30

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    Keywords

    • CHNHPbI
    • Organic-inorganic hybrid perovskite
    • PbI
    • X-ray irradiation

    ASJC Scopus subject areas

    • Renewable Energy, Sustainability and the Environment
    • Electrical and Electronic Engineering
    • Electronic, Optical and Magnetic Materials

    Cite this

    Motoki, K., Miyazawa, Y., Kobayashi, D., Ikegami, M., Miyasaka, T., Yamamoto, T., & Hirose, K. (2018). Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device. In 2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017 (pp. 1-4). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC.2017.8366357