Soft X-ray irradiation effect on surface structure of CH3NH3PbI3 perovskite in multi-film stack device

Keisuke Motoki, Yu Miyazawa, Daisuke Kobayashi, Masashi Ikegami, Tsutomu Miyasaka, Tomoyuki Yamamoto, Kazuyuki Hirose

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Soft X-ray exposure effects on CH3NH3PM3 perovskite in a patterned device sample with a similar structure to solar cells, a promising candidate for X-ray detectors, have been investigated with an X-ray Photoelectron Spectroscopy (XPS) time-dependent measurement method. Our experimental analyses demonstrate compositional change from CH3NH3PM3 to PbI2 due to evaporation of methylammonium iodide.

Original languageEnglish
Title of host publication2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2084-2086
Number of pages3
ISBN (Electronic)9781509056057
DOIs
Publication statusPublished - 2017
Event44th IEEE Photovoltaic Specialist Conference, PVSC 2017 - Washington, United States
Duration: 2017 Jun 252017 Jun 30

Publication series

Name2017 IEEE 44th Photovoltaic Specialist Conference, PVSC 2017

Other

Other44th IEEE Photovoltaic Specialist Conference, PVSC 2017
Country/TerritoryUnited States
CityWashington
Period17/6/2517/6/30

Keywords

  • CHNHPbI
  • Organic-inorganic hybrid perovskite
  • PbI
  • X-ray irradiation

ASJC Scopus subject areas

  • Renewable Energy, Sustainability and the Environment
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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