### Abstract

This paper deals with the source resolvability problem which is one of typical random number generation problems. In the literatures, the achievable rate in the source resolvability problem with respect to the variational distance as well as the Kullback-Leibler (KL) divergence have been analyzed. On the other hand, in this study we consider the problem with respect to a subclass of f-divergence. The f-divergence is a general non-negative measure between two probabilistic distributions and includes several important measures such as the variational distance, the KL divergence, the Hellinger distance and so on. Hence, it is meaningful to consider the source resolvability problem with respect to the f-divergence. We derive the general formula of the optimum achievable rate for a certain subclass of the f-divergence. Then, we reveal that it is easy to derive previous results from our general formula.

Original language | English |
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Title of host publication | 2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings |

Publisher | Institute of Electrical and Electronics Engineers Inc. |

Pages | 2234-2238 |

Number of pages | 5 |

ISBN (Electronic) | 9781538692912 |

DOIs | |

Publication status | Published - 2019 Jul |

Event | 2019 IEEE International Symposium on Information Theory, ISIT 2019 - Paris, France Duration: 2019 Jul 7 → 2019 Jul 12 |

### Publication series

Name | IEEE International Symposium on Information Theory - Proceedings |
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Volume | 2019-July |

ISSN (Print) | 2157-8095 |

### Conference

Conference | 2019 IEEE International Symposium on Information Theory, ISIT 2019 |
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Country | France |

City | Paris |

Period | 19/7/7 → 19/7/12 |

### ASJC Scopus subject areas

- Theoretical Computer Science
- Information Systems
- Modelling and Simulation
- Applied Mathematics

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## Cite this

*2019 IEEE International Symposium on Information Theory, ISIT 2019 - Proceedings*(pp. 2234-2238). [8849401] (IEEE International Symposium on Information Theory - Proceedings; Vol. 2019-July). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2019.8849401